Patent Assignment Details
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| Reel/Frame: | 015068/0216 | |
| Pages: | 2 |
| | Recorded: | 03/09/2004 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/18/2006
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Application #:
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10796270
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Filing Dt:
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03/09/2004
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Publication #:
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Pub Dt:
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10/21/2004
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Title:
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METHODS AND CIRCUITS FOR TESTING PROGRAMMABILITY OF A SEMICONDUCTOR MEMORY CELL AND MEMORY ARRAY USING A BREAKDOWN PHENOMENON IN AN ULTRA-THIN DIELECTRIC
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Assignee
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| 1031 EAST DUANE AVENUE |
| SUNNYVALE, CALIFORNIA 94085 |
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Correspondence name and address
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PERKINS COIE LLP
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PATENT-SEA
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P.O. BOX 1247
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SEATTLE, WA 98111-1247
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