Patent Assignment Details
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| Reel/Frame: | 015340/0219 | |
| Pages: | 5 |
| | Recorded: | 11/05/2004 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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12/27/2005
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Application #:
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10890213
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Filing Dt:
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07/14/2004
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Publication #:
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Pub Dt:
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01/06/2005
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Title:
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SYSTEM FOR MONITORING THE TOPOGRAPHY OF A WAFER SURFACE DURING LITHOGRAPHIC PROCESSING
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Assignee
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| DE RUN 6501 |
| VELDHOVEN, NETHERLANDS NL-5504 DR |
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Correspondence name and address
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STERNE, KESSLER, GOLDSTEIN & FOX P.L.L.C
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1100 NEW YORK AVENUE, N.W.
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WASHINGTON, DC 20005
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