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Patent #:
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Issue Dt:
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09/09/1986
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Application #:
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06637109
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Filing Dt:
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08/02/1984
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Title:
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DOOR-OPERATING APPARATUS FOR ANALYZER
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Patent #:
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Issue Dt:
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10/09/1990
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Application #:
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06780966
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Filing Dt:
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09/25/1985
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Title:
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AUTOMATIC X-RAY CORRECTION DEVICE
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Patent #:
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Issue Dt:
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11/03/1987
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Application #:
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06783247
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Filing Dt:
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10/02/1985
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Title:
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APPARATUS OF REGULATING SHAPE OF FOCUSED ION BEAMS
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Patent #:
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Issue Dt:
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04/26/1988
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Application #:
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06886977
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Filing Dt:
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07/17/1986
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Title:
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ICP MASS SPECTROMETER
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Patent #:
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Issue Dt:
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10/17/1989
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Application #:
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06921820
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Filing Dt:
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10/17/1986
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Title:
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PROCESS FOR FORMING PATTERN FILM
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Patent #:
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Issue Dt:
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05/03/1988
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Application #:
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07012355
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Filing Dt:
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02/09/1987
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Title:
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QUARTZ-TYPE GAS PRESSURE GAUGE
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Patent #:
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Issue Dt:
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08/21/1990
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Application #:
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07020115
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Filing Dt:
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02/27/1987
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Title:
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PROCESS FOR REPAIRING PATTERN FILM
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Patent #:
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Issue Dt:
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05/31/1988
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Application #:
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07024370
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Filing Dt:
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03/10/1987
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Title:
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GAS PRESSURE GAGE
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Patent #:
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Issue Dt:
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10/24/1989
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Application #:
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07031946
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Filing Dt:
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03/27/1987
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Title:
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PROCESS AND APPARATUS FOR FORMING METALLIC PATTERNED FILM
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Patent #:
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Issue Dt:
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09/12/1989
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Application #:
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07071994
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Filing Dt:
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07/10/1987
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Title:
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RELATIVE DISPLACEMENT CONTROL APPARATUS
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Patent #:
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Issue Dt:
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06/06/1989
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Application #:
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07210810
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Filing Dt:
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06/24/1988
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Title:
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TUNNELING SCANNING MICROSCOPE HAVING LIGHT SOURCE
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Patent #:
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Issue Dt:
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06/05/1990
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Application #:
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07227469
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Filing Dt:
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08/02/1988
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Title:
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MASK-REPAIRING DEVICE
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Patent #:
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Issue Dt:
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02/04/1992
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Application #:
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07244128
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Filing Dt:
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09/14/1988
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Title:
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APPARATUS FOR FORMING, CORRECTING PATTERN
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Patent #:
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Issue Dt:
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05/01/1990
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Application #:
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07246359
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Filing Dt:
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09/19/1988
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Title:
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TUNNEL CURRENT DETECTING PHOTO-ACOUSTIC SPECTROMETER
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Patent #:
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Issue Dt:
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02/20/1990
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Application #:
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07257468
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Filing Dt:
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10/13/1988
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Title:
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METHOD OF MEASUREMENT BY SCANNING TUNNELING MICROSCOPE
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Patent #:
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Issue Dt:
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11/13/1990
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Application #:
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07276227
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Filing Dt:
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11/23/1988
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Title:
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APPARATUS AND METHOD FOR TUNNEL CURRENT MEASUREMENT OBSERVED SIMULTANEOUSLY WITH ELECTROCHEMICAL MEASUREMENT
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Patent #:
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Issue Dt:
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07/30/1991
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Application #:
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07328029
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Filing Dt:
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03/23/1989
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Title:
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METHOD OF MANUFACTURING A PLATINUM TIP
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Patent #:
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Issue Dt:
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03/12/1991
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Application #:
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07399910
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Filing Dt:
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08/29/1989
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Title:
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SCANNING TUNNELING MICROSCOPE
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Patent #:
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Issue Dt:
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12/10/1991
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Application #:
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07426430
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Filing Dt:
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10/24/1989
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Title:
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PROCESS FOR FORMING PATTERN FILMS
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Patent #:
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Issue Dt:
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06/09/1992
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Application #:
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07472747
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Filing Dt:
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01/31/1990
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Title:
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APPARATUS FOR SIMULTANEOUSLY EFFECTING ELECTROCHEMICAL MEASUREMENT AND MEASUREMENT OF TUNNELING CURRENT AND TUNNEL PROBE THEREFOR
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Patent #:
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Issue Dt:
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01/07/1992
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Application #:
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07510290
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Filing Dt:
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04/16/1990
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Title:
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X-RAY IMAGE SENSOR
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Patent #:
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Issue Dt:
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04/28/1992
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Application #:
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07510291
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Filing Dt:
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04/16/1990
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Title:
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X-RAY IMAGE SENSOR
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Patent #:
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Issue Dt:
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12/22/1992
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Application #:
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07712117
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Filing Dt:
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06/07/1991
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Title:
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HIGHLY SENSITIVE MAGNETIC FIELD DETECTING SQUID WITH DUAL DEMODULATION CIRCUIT
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Patent #:
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Issue Dt:
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07/27/1993
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Application #:
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07839183
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Filing Dt:
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02/21/1992
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Title:
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APPARATUS FOR DETECTING A FINE MAGNETIC FIELD WITH A SIGNAL ADJUSTING CIRCUIT IN A DC SQUID
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Patent #:
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Issue Dt:
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04/26/1994
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Application #:
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07840343
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Filing Dt:
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02/24/1992
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Title:
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PROCESS FOR MANUFACTURING DC SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE
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Patent #:
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Issue Dt:
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01/18/1994
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Application #:
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07840344
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Filing Dt:
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02/24/1992
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Title:
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APPARATUS FOR DETECTING A FINE MAGNETIC FIELD WITH CHARACTERISTIC TESTING FUNCTION OF A DC SQUID
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Patent #:
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Issue Dt:
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07/12/1994
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Application #:
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07914894
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Filing Dt:
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07/15/1992
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Title:
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MAGNETIC FIELD DETECTION COILS WITH SUPERCONDUCTING WIRING PATTERN ON FLEXIBLE FILM
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Patent #:
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Issue Dt:
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04/19/1994
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Application #:
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07954317
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Filing Dt:
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09/30/1992
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Title:
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HIGH RESOLUTION OBSERVATION APPARATUS WITH PHOTON SCANNING MICROSCOPE
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Patent #:
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Issue Dt:
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09/12/1995
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Application #:
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08095968
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Filing Dt:
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07/22/1993
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Title:
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FINE SURFACE OBSERVING APPARATUS
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Patent #:
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Issue Dt:
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04/18/1995
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Application #:
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08106409
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Filing Dt:
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08/13/1993
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Title:
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ATOMIC FORCE MICROSCOPE
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Patent #:
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Issue Dt:
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06/27/2000
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Application #:
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08200820
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Filing Dt:
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02/23/1994
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Title:
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CANTILEVER MAGNETIC FORCE SENSOR FOR MAGNETIC FORCE MICROSCOPY HAVING A MAGNETIC PROBE COATED WITH A HARD-MEGNETIC MATERIAL.
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Patent #:
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Issue Dt:
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04/22/1997
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Application #:
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08295236
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Filing Dt:
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08/24/1994
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Title:
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METHOD AND APPARATUS FOR MEASURING A MAGNETIC FIELD USING A MAGNETIC FORCE MICROSCOPE BY MAGNETIZING A PROBE AND CORRECTING A DETECTED MAGNETIC FIELD
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Patent #:
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Issue Dt:
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09/24/1996
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Application #:
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08302503
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Filing Dt:
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09/08/1994
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Title:
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PLASMA ION SOURCE MASS ANALYZING APPARATUS
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Patent #:
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Issue Dt:
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01/21/1997
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Application #:
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08306411
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Filing Dt:
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09/15/1994
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Title:
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HIGHLY SENSITIVE MAGNETIC FIELD DETECTOR USING LOW-NOISE DC SQUID
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Patent #:
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Issue Dt:
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09/26/1995
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Application #:
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08324740
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Filing Dt:
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10/18/1994
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Title:
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PROBE MICROSCOPE HAVING ERROR CORRECTION PIEZOELECTRIC SCANNER
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Patent #:
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Issue Dt:
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04/23/1996
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Application #:
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08325805
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Filing Dt:
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10/19/1994
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Title:
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METHOD OF X-RAY MAPPING ANALYSIS
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Patent #:
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Issue Dt:
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10/20/1998
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Application #:
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08325813
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Filing Dt:
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10/19/1994
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Title:
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NONDESTRUCTIVE TESTING SYSTEM USING A SQUID
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Patent #:
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Issue Dt:
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08/20/1996
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Application #:
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08366363
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Filing Dt:
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12/29/1994
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Title:
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DC SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE WITH SHIELD LAYER
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Patent #:
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Issue Dt:
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05/06/1997
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Application #:
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08408622
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Filing Dt:
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03/22/1995
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Title:
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SCANNING NEAR-FIELD OPTIC/ATOMIC FORCE MICROSCOPE IN WHICH IMAGING LIGHT IS CONTROLLED ON RELATION TO A VIBRATING POSITION OF AN OPTICAL FIBER PROBE
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Patent #:
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Issue Dt:
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02/02/1999
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08513541
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08/10/1995
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Title:
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SAMPLE INTRODUCING DEVICE FOR INDUCTIVELY COUPLED PLASMA ANALYZER
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Issue Dt:
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10/13/1998
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Application #:
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08525348
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09/07/1995
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Title:
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SCANNING NEAR-FIELD OPTIC/ATOMIC-FORCE MICROSCOPE WITH OBSERVING FUNCTION IN LIQUID
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Issue Dt:
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09/08/1998
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08528956
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09/15/1995
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Title:
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ATOMIC FORCE MICROSCOPE AND METHOD OF ANALYZING FRICTIONS IN ATOMIC FORCE MICROSCOPE
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Issue Dt:
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06/30/1998
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08585953
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01/16/1996
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Title:
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PLASMA ION SOURCE MASS SPECTROMETER
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Issue Dt:
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10/20/1998
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08635034
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04/19/1996
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Title:
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RADIAL DIFFERENTIAL SQUID MAGNETIC FLUX METER
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Issue Dt:
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11/10/1998
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08699894
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08/16/1996
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Title:
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NONDESTRUCTIVE INSPECTION APPARATUS WITH SUPERCONDUCTING MAGNETIC SENSOR
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Patent #:
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Issue Dt:
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04/21/1998
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08728942
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10/11/1996
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Title:
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SCANNING PROBE MICROSCOPE AND METHOD FOR OBTAINING TOPOGRAPHIC IMAGE, SURFACE POTENTIAL IMAGE, AND ELECTROSTATIC CAPACITANCE DISTRIBUTION IMAGE
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Patent #:
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Issue Dt:
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12/29/1998
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08739307
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10/29/1996
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Title:
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SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE FLUXMETER AND NONDESTRUCTIVE INSPECTION APPARATUS
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09/21/1999
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Application #:
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08763674
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12/06/1996
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Title:
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METHOD OF CONTROLLING PROBE MICROSCOPE
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Patent #:
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Issue Dt:
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08/17/1999
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Application #:
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08764214
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12/13/1996
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Title:
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SCANNING TYPE NEAR FIELD INTERATOMIC FORCE MICROSCOPE
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Patent #:
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Issue Dt:
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08/31/1999
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Application #:
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08800074
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Filing Dt:
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02/12/1997
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Title:
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SCANNING PROBE MICROSCOPE AND MICRO-AREA PROCESSING MACHINE BOTH HAVINGMICRO-POSITIONING MECHANISM
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Patent #:
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Issue Dt:
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03/02/1999
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Application #:
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08812846
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03/06/1997
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Title:
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PROBE FOR ATOMIC FORCE MICROSCOPE AND ATOMIC FORCE MICROSCOPE
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Patent #:
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Issue Dt:
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04/13/1999
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Application #:
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08815816
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03/12/1997
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Title:
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SCANNING NEAR FIELD OPTICAL MICROSCOPE
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Patent #:
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04/11/2000
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08842845
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04/17/1997
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Title:
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SCANNING PROBE MICROSCOPE AND SEMICONDUCTOR DISTORTION SENSOR FOR USE THEREIN
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Patent #:
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Issue Dt:
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06/20/2000
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Application #:
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08855543
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05/13/1997
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Title:
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PROBE SCANNING APPARATUS
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Issue Dt:
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08/10/1999
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08872430
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06/10/1997
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Title:
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MICRO FLUORESCENT X-RAY ANALYZER
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12/29/1998
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08879342
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06/20/1997
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ION BEAM MACHINING METHOD AND DEVICE THEREOF
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10/12/1999
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08968193
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11/12/1997
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Title:
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PROBE SCANNING APPARATUS FOR PROBE MICROSCOPE
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Issue Dt:
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11/30/1999
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08987734
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12/09/1997
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CANTILEVER PROBE AND SCANNING TYPE PROBE MICROSCOPE UTILIZING THE CANTILEVER PROBE
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03/14/2000
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09008161
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01/16/1998
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ELECTRON BEAM DEVICE
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04/18/2000
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09016450
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01/30/1998
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Title:
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PROBE SCANNING DEVICE
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09/04/2001
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09027093
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02/20/1998
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SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE HAVING BIAS WIRING
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02/27/2001
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09038259
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03/10/1998
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Title:
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SCANNING NEAR-FIELD OPTICAL MICROSCOPE
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02/15/2000
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09050791
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03/30/1998
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Title:
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SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE AND NON-DESTRUCTIVE EVALUATION APPARATUS USING THE SAME
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03/13/2001
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09057349
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04/08/1998
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SCANNING PROBE MICROSCOPE HAVING QUARTZ OSCILLATOR FOR CONTROLLING POSITION OF PROBE
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09/05/2000
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09057422
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04/08/1998
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Title:
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X-RAY FLUORESCENCE ANALYZER CAPABLE OF DETERMINING THE CENTER OF A SAMPLE
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11/23/1999
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09057809
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Filing Dt:
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04/09/1998
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Title:
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APPARATUS FOR MACHINING, RECORDING, AND REPRODUCING, USING SCANNING PROBE MICROSCOPE
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Patent #:
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Issue Dt:
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11/16/1999
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Application #:
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09059455
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Filing Dt:
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04/13/1998
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Title:
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SCANNING PROBE MICROSCOPE
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Patent #:
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02/06/2001
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Application #:
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09061800
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04/16/1998
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Title:
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SURFACE ANALYZING APPARATUS WITH ANTI-VIBRATION TABLE
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Patent #:
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Issue Dt:
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09/19/2000
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Application #:
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09064480
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04/22/1998
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Title:
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OPTICAL PROBE, METHOD OF MANUFACTURING AN OPTICAL PROBE, AND SCANNING PROBE MICROSCOPE
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12/14/1999
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09078470
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05/14/1998
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INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRIC AND SPECTROCHEMICAL ANALYZER
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08/08/2000
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09097478
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06/15/1998
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Title:
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MICROSCOPIC AREA SCANNING APPARATUS
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Patent #:
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Issue Dt:
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06/05/2001
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Application #:
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09116319
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Filing Dt:
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07/15/1998
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Title:
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SCANNING PROBE MICROSCOPE
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Patent #:
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Issue Dt:
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08/29/2000
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Application #:
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09118596
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Filing Dt:
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07/17/1998
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Title:
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NONDESTRUCTIVE METHOD OF QUANTITATIVELY EVALUATING DEGREE OF PLASTICITY OF STEEL MATERIAL
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Patent #:
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Issue Dt:
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08/01/2000
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Application #:
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09123146
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Filing Dt:
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07/27/1998
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Title:
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SAMPLING SCANNING PROBE MICROSCOPE AND SAMPLING METHOD THEREOF
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Patent #:
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Issue Dt:
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04/10/2001
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Application #:
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09124128
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Filing Dt:
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07/29/1998
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Title:
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THREE-DIMENSIONAL SCANNING PROBE MICROSCOPE
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Patent #:
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Issue Dt:
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01/01/2002
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Application #:
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09126404
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Filing Dt:
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07/30/1998
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Title:
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OBJECT LENS FOR SCANNING ELECTRON MICROSCOPE
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Patent #:
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Issue Dt:
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09/18/2001
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Application #:
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09131456
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Filing Dt:
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08/10/1998
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Title:
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SCANNING PROBE MICROSCOPE
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Patent #:
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Issue Dt:
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04/03/2001
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Application #:
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09173035
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Filing Dt:
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10/15/1998
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Title:
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SEMICONDUCTOR STRAIN SENSOR AND SCANNING PROBE MICROSCOPE USING THE SEMICONDUCTOR STRAIN SENSOR
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Patent #:
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Issue Dt:
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05/14/2002
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Application #:
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09197584
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Filing Dt:
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11/19/1998
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Title:
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SELF-DETECTING TYPE OF SPM PROBE AND SPM DEVICE
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Patent #:
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01/09/2001
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Application #:
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09197585
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Filing Dt:
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11/23/1998
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Title:
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SEMICONDUCTOR MANUFACTURING DEVICE
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Patent #:
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Issue Dt:
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09/25/2001
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Application #:
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09197586
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Filing Dt:
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11/19/1998
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Title:
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METHOD OF PROCESSING CIRCULAR PATTERNING
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Patent #:
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Issue Dt:
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01/23/2001
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Application #:
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09197587
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Filing Dt:
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11/19/1998
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Title:
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CANTILEVER UNIT AND SCANNING PROBE MICROSCOPE UTILIZING THE CANTILEVER UNIT.
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Patent #:
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Issue Dt:
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03/27/2001
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Application #:
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09199239
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Filing Dt:
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11/24/1998
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Title:
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VISCOELASTICITY MEASUREMENT APPARATUS
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Patent #:
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Issue Dt:
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04/03/2001
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Application #:
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09200311
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Filing Dt:
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11/25/1998
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Title:
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HIGH-SPEED THERMAL ANALYZER
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Patent #:
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Issue Dt:
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07/10/2001
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Application #:
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09201182
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Filing Dt:
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11/30/1998
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Title:
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SURFACE ANALYZING APPARATUS
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Patent #:
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Issue Dt:
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07/23/2002
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Application #:
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09204650
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Filing Dt:
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12/02/1998
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Title:
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DIFFERENTIAL SCANNING CALORIMETER
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Patent #:
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Issue Dt:
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11/14/2000
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Application #:
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09204894
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Filing Dt:
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12/03/1998
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Title:
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FOCUSED ION BEAM LITHOGRAPHY METHOD WITH SAMPLE INSPECTION THROUGH OBLIQUE ANGLE TILT
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Patent #:
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Issue Dt:
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06/04/2002
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Application #:
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09227231
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Filing Dt:
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01/08/1999
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Title:
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SCANNING ELECTRONIC MICROSCOPE AND METHOD FOR AUTOMATICALLY OBSERVING SEMICONDUCTOR WAFER
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Patent #:
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Issue Dt:
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11/14/2000
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Application #:
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09232472
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Filing Dt:
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01/15/1999
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Title:
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DIFFERENTIAL THERMAL ANALYZER
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Patent #:
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Issue Dt:
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01/23/2001
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Application #:
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09235667
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Filing Dt:
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01/22/1999
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Title:
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METHOD OF OBSERVING SECONDARY ION IMAGE BY FOCUSED ION BEAM
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Patent #:
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Issue Dt:
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03/19/2002
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Application #:
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09235668
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Filing Dt:
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01/22/1999
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Title:
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PROBE FOR ATOMIC FORCE MICROSCOPE, METHOD OF FABRICATING SAME, AND ATOMIC FORCE MICROSCOPE
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Patent #:
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Issue Dt:
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01/16/2001
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Application #:
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09243919
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Filing Dt:
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02/03/1999
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Title:
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IN-LINE FLUORESCENT X-RAY FILM THICKNESS MONITOR
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Patent #:
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Issue Dt:
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12/31/2002
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09252397
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Filing Dt:
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02/18/1999
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Title:
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SCANNING PROBE MICROSCOPE AND METHOD OF MEASURING GEOMETRY OF SAMPLE SURFACE WITH SCANNING PROBE MICROSCOPE
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Patent #:
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Issue Dt:
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05/14/2002
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Application #:
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09255548
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Filing Dt:
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02/22/1999
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Title:
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PROBE FOR NEAR-FIELD OPTICAL MICROSCOPE, METHOD FOR MANUFACTURING THE SAME AND SCANNING NEAR-FIELD OPTICAL MICROSCOPE
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Patent #:
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Issue Dt:
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05/01/2001
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Application #:
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09264142
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Filing Dt:
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03/05/1999
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Title:
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FOCUSED ION BEAM SYSTEM
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Patent #:
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Issue Dt:
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12/18/2001
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Application #:
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09271805
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Filing Dt:
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03/18/1999
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Title:
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SECTION FORMATION OBSERVING METHOD
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Patent #:
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Issue Dt:
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05/21/2002
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Application #:
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09286050
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Filing Dt:
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04/05/1999
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Title:
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FOCUSED ION BEAM FORMING METHOD AND METHOD OF FORMING A FILM PATTERN USING A FOCUSED ION BEAM
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Patent #:
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Issue Dt:
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01/23/2001
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Application #:
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09293091
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Filing Dt:
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04/16/1999
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Title:
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PORTABLE-TYPE FLUORESCENT X-RAY ANALYZER
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Patent #:
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Issue Dt:
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06/18/2002
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Application #:
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09296081
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Filing Dt:
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04/21/1999
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Title:
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CORRELATION SAMPLE FOR SCANNING PROBE MICROSCOPE AND METHOD OF PROCESSING THE CORRELATION SAMPLE
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Patent #:
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Issue Dt:
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10/16/2001
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Application #:
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09310766
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Filing Dt:
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05/13/1999
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Title:
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COORDINATING OPTICAL TYPE OBSERVING APPARATUS AND LASER MARKING METHOD
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