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Patent Assignment Details

NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:	015711/0053			Pages:	9
		Recorded:	02/09/2005
Conveyance:	ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Total properties: 172
Page 2 of 2
Pages: 1 2

Patent #:	6348689	Issue Dt:	02/19/2002	Application #:	09310767	Filing Dt:	05/13/1999
Title:	FOCUSED ION BEAM APPARATUS

Patent #:	6486471	Issue Dt:	11/26/2002	Application #:	09313116	Filing Dt:	05/17/1999
Title:	COMPOSITE CHARGED PARTICLE BEAM APPARATUS

Patent #:	6257757	Issue Dt:	07/10/2001	Application #:	09313117	Filing Dt:	05/17/1999
Title:	THERMAL ANALYSYS APPARATUS

Patent #:	6452172	Issue Dt:	09/17/2002	Application #:	09313118	Filing Dt:	05/17/1999
Title:	COMPOSITE CHARGED PARTICLE BEAM APPARATUS

Patent #:	6384418	Issue Dt:	05/07/2002	Application #:	09314060	Filing Dt:	05/18/1999
Title:	"SAMPLE TRANSFER APPARATUS AND SAMPLE STAGE"

Patent #:	6452173	Issue Dt:	09/17/2002	Application #:	09315717	Filing Dt:	05/20/1999
Title:	CHARGED PARTICLE APPARATUS

Patent #:	6530686	Issue Dt:	03/11/2003	Application #:	09319624	Filing Dt:	09/23/1999
Title:	DIFFERENTIAL SCANNING CALORIMETER HAVING LOW DRIFT AND HIGH RESPONSE CHARACTERISTICS

Patent #:	6383823	Issue Dt:	05/07/2002	Application #:	09328139	Filing Dt:	06/08/1999
Title:	PROBE FOR SCANNING PROBE MICROSCOPE (SPM) AND SPM DEVICE

Patent #:	6257053	Issue Dt:	07/10/2001	Application #:	09337613	Filing Dt:	06/21/1999
Title:	SCANNING PROBE MICROSCOPE HAVING PIEZOELECTRIC MEMBER FOR CONTROLLING MOVEMENT OF PROBE

Patent #:	6239426	Issue Dt:	05/29/2001	Application #:	09348319	Filing Dt:	07/07/1999
Title:	SCANNING PROBE AND SCANNING PROBE MICROSCOPE

Patent #:	6390669	Issue Dt:	05/21/2002	Application #:	09351504	Filing Dt:	07/12/1999
Title:	HEAT FLUX TYPE DIFFERENTIAL SCANNING CALORIMETER

Patent #:	6281497	Issue Dt:	08/28/2001	Application #:	09351506	Filing Dt:	07/12/1999
Title:	RADIOACTIVE RAY DETECTING DEVICE

Patent #:	6542084	Issue Dt:	04/01/2003	Application #:	09355226	Filing Dt:	10/15/1999
Title:	THERMAL ANALYZER

Patent #:	6295333	Issue Dt:	09/25/2001	Application #:	09359938	Filing Dt:	07/22/1999
Title:	FLUORESCENT X-RAY ANALYZER

Patent #:	6281496	Issue Dt:	08/28/2001	Application #:	09360775	Filing Dt:	07/26/1999
Title:	OBSERVING/FORMING METHOD WITH FOCUSED ION BEAM AND APPARATUS THEREFOR

Patent #:	6430324	Issue Dt:	08/06/2002	Application #:	09378209	Filing Dt:	08/19/1999
Title:	OPTICAL PROBE AND METHOD FOR MANUFACTURING SAME AND SCANNING PROXIMITY FIELD OPTICAL MICROSCOPE

Patent #:	6323645	Issue Dt:	11/27/2001	Application #:	09389254	Filing Dt:	09/03/1999
Title:	SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE

Patent #:	6250799	Issue Dt:	06/26/2001	Application #:	09482805	Filing Dt:	01/13/2000
Title:	THERMAL ANALYZING APPARATUS

Patent #:	6390674	Issue Dt:	05/21/2002	Application #:	09482807	Filing Dt:	01/13/2000
Title:	THERMAL ANALYSIS APPARATUS AND METHOD CAPABLE OF ACCURATELY MEASURING A TEMPERATURE OF A LARGE DIAMETER SAMPLE

Patent #:	6593571	Issue Dt:	07/15/2003	Application #:	09483727	Filing Dt:	01/14/2000
Title:	SCANNING PROBE MICROSCOPE

Patent #:	6645434	Issue Dt:	11/11/2003	Application #:	09512115	Filing Dt:	02/24/2000
Title:	SAMPLE OBSERVATION PLATE AND OBSERVATION APPARATUS

Patent #:	6469293	Issue Dt:	10/22/2002	Application #:	09514096	Filing Dt:	02/28/2000
Title:	MULTIPROBE AND SCANNING PROBE MICROSCOPE

Patent #:	6422069	Issue Dt:	07/23/2002	Application #:	09526148	Filing Dt:	03/15/2000
Title:	SELF-EXCITING AND SELF-DETECTING PROBE AND SCANNING PROBE APPARATUS

Patent #:	6435015	Issue Dt:	08/20/2002	Application #:	09526163	Filing Dt:	03/15/2000
Title:	SCANNING PROBE MICROSCOPE

Patent #:	6404846	Issue Dt:	06/11/2002	Application #:	09531662	Filing Dt:	03/20/2000
Title:	FLUORESCENT X-RAY METHOD FOR DETERMINING X-RAY ALIGNMENT BY LUMINESCENT CHANGES

Patent #:	6724929	Issue Dt:	04/20/2004	Application #:	09537945	Filing Dt:	03/29/2000
Title:	WAFER INSPECTING APPARATUS

Patent #:	6539075	Issue Dt:	03/25/2003	Application #:	09546765	Filing Dt:	04/11/2000
Title:	SLIGHT AMOUNT SAMPLE ANALYZING APPARATUS

Patent #:	6402370	Issue Dt:	06/11/2002	Application #:	09558616	Filing Dt:	04/26/2000
Title:	THERMAL ANALYSIS APPARATUS

Patent #:	6373246	Issue Dt:	04/16/2002	Application #:	09559376	Filing Dt:	04/27/2000
Title:	CANTILEVER MAGNETIC FORCE SENSOR FOR MAGNETIC FORCE MICROSCOPY AND METHOD OF MANUFACTURING MAGNETIC FORCE SENSOR

Patent #:	6403958	Issue Dt:	06/11/2002	Application #:	09584562	Filing Dt:	05/31/2000
Title:	METHOD FOR PREPARING A SAMPLE FOR A TRANSMISSION ELECTRON MICROSCOPE

Patent #:	6359962	Issue Dt:	03/19/2002	Application #:	09590200	Filing Dt:	06/08/2000
Title:	Flourescent x-ray analyzer

Patent #:	6300328	Issue Dt:	10/09/2001	Application #:	09627914	Filing Dt:	07/28/2000
Title:	Selective inhibitors of adenosine monophosphate deaminase for the treatment of optic nerve and retinal damage

Patent #:	6386045	Issue Dt:	05/14/2002	Application #:	09670654	Filing Dt:	09/27/2000
Title:	Dynamic viscoelasticity measuring system

Patent #:	6472881	Issue Dt:	10/29/2002	Application #:	09673941	Filing Dt:	11/21/2000
Title:	LIQUID METAL ION SOURCE AND METHOD FOR MEASURING FLOW IMPEDANCE OF LIQUID METAL ION SOURCE

Patent #:	6544692	Issue Dt:	04/08/2003	Application #:	09700638	Filing Dt:	02/26/2001
Title:	BLACK DEFECT CORRECTION METHOD AND BLACK DEFECT CORRECTION DEVICE FOR PHOTOMASK

Patent #:	6467426	Issue Dt:	10/22/2002	Application #:	09701605	Filing Dt:	01/30/2001
Title:	PHOTOMASK CORRECTION DEVICE

Patent #:	6489612	Issue Dt:	12/03/2002	Application #:	09701606	Filing Dt:	01/30/2001
Title:	METHOD OF MEASURING FILM THICKNESS

Patent #:	6529848	Issue Dt:	03/04/2003	Application #:	09734268	Filing Dt:	12/11/2000
Publication #:	US20010004730	Pub Dt:	06/21/2001
Title:	THERMAL ANALYSIS APPARATUS

Patent #:	6504164	Issue Dt:	01/07/2003	Application #:	09740662	Filing Dt:	12/19/2000
Publication #:	US20010011702	Pub Dt:	08/09/2001
Title:	ELECTRON BEAM APPARATUS

Patent #:	6685847	Issue Dt:	02/03/2004	Application #:	09754645	Filing Dt:	01/04/2001
Publication #:	US20010010841	Pub Dt:	08/02/2001
Title:	METHOD FOR OBSERVING CROSS-SECTIONAL STRUCTURE OF SAMPLE

Patent #:	6593583	Issue Dt:	07/15/2003	Application #:	09754649	Filing Dt:	03/22/2001
Publication #:	US20010032936	Pub Dt:	10/25/2001
Title:	ION BEAM PROCESSING POSITION CORRECTION METHOD

Patent #:	6571612	Issue Dt:	06/03/2003	Application #:	09754651	Filing Dt:	03/02/2001
Publication #:	US20010032496	Pub Dt:	10/25/2001
Title:	PROBE SCANNING METHOD

Patent #:	6648503	Issue Dt:	11/18/2003	Application #:	09760030	Filing Dt:	01/12/2001
Publication #:	US20020003830	Pub Dt:	01/10/2002
Title:	CALORIMETER AND MANUFACTURING METHOD THEREOF

Patent #:	6664540	Issue Dt:	12/16/2003	Application #:	09778459	Filing Dt:	02/07/2001
Publication #:	US20010028033	Pub Dt:	10/11/2001
Title:	MICROPROBE AND SAMPLE SURFACE MEASURING APPARATUS

Patent #:	6379986	Issue Dt:	04/30/2002	Application #:	09778462	Filing Dt:	02/07/2001
Title:	METHOD OF FORMING TUNNEL OXIDE FILM FOR SUPERCONDUCTING X-RAY SENSOR ELEMENT

Patent #:	6474079	Issue Dt:	11/05/2002	Application #:	09780840	Filing Dt:	02/09/2001
Publication #:	US20010023592	Pub Dt:	09/27/2001
Title:	COOLING APPARATUS

Patent #:	6667467	Issue Dt:	12/23/2003	Application #:	09803862	Filing Dt:	03/12/2001
Publication #:	US20020020805	Pub Dt:	02/21/2002
Title:	MICROPROBE AND SCANNING PROBE APPARATUS HAVING MICROPROBE

Patent #:	6542349	Issue Dt:	04/01/2003	Application #:	09827121	Filing Dt:	04/05/2001
Publication #:	US20010038520	Pub Dt:	11/08/2001
Title:	PORTABLE X-RAY FLUORESCENCE ANALYZER

Patent #:	6496565	Issue Dt:	12/17/2002	Application #:	09827123	Filing Dt:	04/05/2001
Publication #:	US20010038684	Pub Dt:	11/08/2001
Title:	X-RAY FLUORESCENCE ANALYSIS APPARATUS

Patent #:	6590955	Issue Dt:	07/08/2003	Application #:	09827124	Filing Dt:	04/05/2001
Publication #:	US20010028698	Pub Dt:	10/11/2001
Title:	OPEN CHAMBER-TYPE X-RAY ANALYSIS APPARATUS

Patent #:	6486573	Issue Dt:	11/26/2002	Application #:	09827125	Filing Dt:	04/05/2001
Publication #:	US20010038248	Pub Dt:	11/08/2001
Title:	PORTABLE X-RAY FLUORESCENCE ANALYZER

Patent #:	6632015	Issue Dt:	10/14/2003	Application #:	09837835	Filing Dt:	04/18/2001
Publication #:	US20010038660	Pub Dt:	11/08/2001
Title:	THERMAL ANALYSIS APPARATUS

Patent #:	6388249	Issue Dt:	05/14/2002	Application #:	09878869	Filing Dt:	06/11/2001
Publication #:	US20010048076	Pub Dt:	12/06/2001
Title:	SURFACE ANALYZING APPARATUS

Patent #:	6661006	Issue Dt:	12/09/2003	Application #:	09888776	Filing Dt:	06/25/2001
Publication #:	US20020005482	Pub Dt:	01/17/2002
Title:	SCANNING PROBE INSTRUMENT

Patent #:	6563902	Issue Dt:	05/13/2003	Application #:	09893715	Filing Dt:	06/28/2001
Publication #:	US20020009177	Pub Dt:	01/24/2002
Title:	ENERGY DISPERSIVE X-RAY ANALYZER

Patent #:	6522718	Issue Dt:	02/18/2003	Application #:	09903236	Filing Dt:	07/12/2001
Publication #:	US20020025020	Pub Dt:	02/28/2002
Title:	X-RAY FLUORESCENCE THICKNESS TESTER

Patent #:	6400795	Issue Dt:	06/04/2002	Application #:	09910107	Filing Dt:	07/20/2001
Publication #:	US20020018541	Pub Dt:	02/14/2002
Title:	X-RAY FLUORESCENCE ANALYZER

Patent #:	6683307	Issue Dt:	01/27/2004	Application #:	09910109	Filing Dt:	07/20/2001
Publication #:	US20020017606	Pub Dt:	02/14/2002
Title:	SCANNING TYPE CHARGED PARTICLE BEAM MICROSCOPE

Patent #:	6535573	Issue Dt:	03/18/2003	Application #:	09915447	Filing Dt:	07/26/2001
Publication #:	US20020015471	Pub Dt:	02/07/2002
Title:	X-RAY FLUORESCENCE ANALYZER

Patent #:	6426993	Issue Dt:	07/30/2002	Application #:	09934006	Filing Dt:	08/20/2001
Publication #:	US20020071519	Pub Dt:	06/13/2002
Title:	ENERGY DISPERSION-TYPE X-RAY DETECTION SYSTEM

Patent #:	6552537	Issue Dt:	04/22/2003	Application #:	09944362	Filing Dt:	08/31/2001
Publication #:	US20020097047	Pub Dt:	07/25/2002
Title:	SUPERCONDUCTIVE QUANTUM INTERFERENCE ELEMENT

Patent #:	6508585	Issue Dt:	01/21/2003	Application #:	09998356	Filing Dt:	11/30/2001
Publication #:	US20020085615	Pub Dt:	07/04/2002
Title:	DIFFERENTIAL SCANNING CALORIMETER

Patent #:	6544897	Issue Dt:	04/08/2003	Application #:	10001332	Filing Dt:	10/26/2001
Publication #:	US20020081507	Pub Dt:	06/27/2002
Title:	METHOD FOR FORMING A VERTICAL EDGE SUBMICRON THROUGH-HOLE AND A THIN FILM SAMPLE WITH THIS KIND OF THROUGH-HOLE

Patent #:	6616330	Issue Dt:	09/09/2003	Application #:	10001335	Filing Dt:	10/26/2001
Publication #:	US20020080848	Pub Dt:	06/27/2002
Title:	AUTOMATIC HUMIDITY STEP CONTROL THERMAL ANALYSIS APPARATUS

Patent #:	6686600	Issue Dt:	02/03/2004	Application #:	10005034	Filing Dt:	12/04/2001
Publication #:	US20020074496	Pub Dt:	06/20/2002
Title:	TEM SAMPLE SLICING PROCESS

Patent #:	6596992	Issue Dt:	07/22/2003	Application #:	10017123	Filing Dt:	12/14/2001
Publication #:	US20020088937	Pub Dt:	07/11/2002
Title:	METHOD OF OPERATING SCANNING PROBE MICROSCOPE

Patent #:	6617579	Issue Dt:	09/09/2003	Application #:	10021332	Filing Dt:	10/29/2001
Publication #:	US20020088941	Pub Dt:	07/11/2002
Title:	SCANNING ELECTRONIC BEAM APPARATUS

Patent #:	6597169	Issue Dt:	07/22/2003	Application #:	10021417	Filing Dt:	10/29/2001
Publication #:	US20020128156	Pub Dt:	09/12/2002
Title:	SIGNAL DETECTOR USING SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE AND MEASURING METHOD THEREFORE

Patent #:	6703626	Issue Dt:	03/09/2004	Application #:	10047974	Filing Dt:	01/15/2002
Publication #:	US20020096635	Pub Dt:	07/25/2002
Title:	MASK DEFECT REPAIR METHOD

Patent #:	6642512	Issue Dt:	11/04/2003	Application #:	10055292	Filing Dt:	01/23/2002
Publication #:	US20020100871	Pub Dt:	08/01/2002
Title:	FOCUSED ION BEAM APPARATUS

Patent #:	6576913	Issue Dt:	06/10/2003	Application #:	10140710	Filing Dt:	05/08/2002
Publication #:	US20020171050	Pub Dt:	11/21/2002
Title:	FOCUSED ION BEAM APPARATUS HAVING A GAS INJECTOR IN WHICH ONE OF A PLURALITY OF NOZZLES CAN BE SELECTIVELY DRIVEN FOR ELEVATION

Patent #:	6584169	Issue Dt:	06/24/2003	Application #:	10153508	Filing Dt:	05/22/2002
Publication #:	US20020186810	Pub Dt:	12/12/2002
Title:	X-RAY MAPPING ANALYSIS METHOD

Assignor

SEIKO INSTRUMENTS INC.

Exec Dt:

01/28/2005

Assignee

SII NANOTECHNOLOGY INC.

8, NAKASE 1-CHOME MIHAMA-KU

CHIBA-SHIBA, CHIBA, JAPAN

Correspondence name and address
	ADAMS & WILKS
	BRUCE L. ADAMS, ESQ.
	50 BROADWAY-31ST FL.
	NEW YORK, NY 10004

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