Patent Assignment Details
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| Reel/Frame: | 015954/0720 | |
| Pages: | 4 |
| | Recorded: | 11/05/2004 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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07/10/2007
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Application #:
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10503701
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Filing Dt:
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06/27/2005
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Publication #:
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Pub Dt:
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11/03/2005
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Title:
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SCANNING PROBE MICROSCOPE AND SPECIMEN SURFACE STRUCTURE MEASURING METHOD
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Assignee
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| 2-1, HIROSAWA, WAKO-SHI |
| SAITAMA, JAPAN 351-1098 |
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Correspondence name and address
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GARY M. BUTTLER
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BAKER BOTTS L.L.P.
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30 ROCKEFELLER PLAZA -FL.
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NEW YORK, NY 10112
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