Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 016069/0098 | |
| Pages: | 8 |
| | Recorded: | 12/13/2004 | | |
| Attorney Dkt #: | 50090-332 |
| Conveyance: | CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). |
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Total properties:
2
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Patent #:
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Issue Dt:
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11/04/2003
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Application #:
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09904625
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Filing Dt:
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07/16/2001
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Publication #:
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Pub Dt:
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05/23/2002
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Title:
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TESTER FOR SEMICONDUCTOR INTEGRATED CIRCUITS AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUITS
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Patent #:
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Issue Dt:
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05/31/2005
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Application #:
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09927368
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Filing Dt:
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08/13/2001
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Publication #:
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Pub Dt:
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08/08/2002
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Title:
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APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT
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Assignee
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| 1 MIZUHARA 4-CHOME, ITAMI-SHI |
| HYOGO 664-0005, JAPAN |
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Correspondence name and address
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MCDERMOTT WILL & EMERY LLP
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ALEXANDER V. YAMPOLSKY
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600 13TH STREET, N.W.
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WASHINGTON, D.C. 20005-3096
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