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Reel/Frame:016078/0133   Pages: 3
Recorded: 04/14/2005
Attorney Dkt #:8651/p1/ppc/cmp
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
11034349
Filing Dt:
01/11/2005
Publication #:
Pub Dt:
03/23/2006
Title:
Patterned wafer thickness detection system
Assignors
1
Exec Dt:
01/10/2005
2
Exec Dt:
01/10/2005
3
Exec Dt:
01/09/2005
4
Exec Dt:
01/06/2005
5
Exec Dt:
12/28/2004
Assignee
1
3050 BOWERS AVENUE
SANTA CLARA, CALIFORNIA 95054
Correspondence name and address
ROBERT W. MULCAHY
APPLIED MATERIALS, INC.
P.O. BOX 1450
SANTA CLARA, CA 95052

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