|
Total properties:
83
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|
|
|
Patent #:
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|
Issue Dt:
|
07/18/1989
|
Application #:
|
07130886
|
Filing Dt:
|
12/10/1987
|
|
Title:
|
METHOD FOR REPAIRING A PATTERN FILM
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|
Patent #:
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|
Issue Dt:
|
07/25/1989
|
Application #:
|
07138360
|
Filing Dt:
|
12/24/1987
|
|
Title:
|
APPARATUS FOR REPAIRING A PATTERN FILM
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/20/1990
|
Application #:
|
07157922
|
Filing Dt:
|
02/19/1988
|
|
Title:
|
METHOD OF CORRECTING A PATTERN FILM
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|
|
|
Patent #:
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|
Issue Dt:
|
10/17/1989
|
Application #:
|
07272017
|
Filing Dt:
|
11/16/1988
|
|
Title:
|
METHOD AND APPARATUS FOR MODIFYING PATTERNED FILM
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|
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|
Patent #:
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|
Issue Dt:
|
01/08/1991
|
Application #:
|
07373035
|
Filing Dt:
|
06/29/1989
|
|
Title:
|
FOCUSED ION BEAM APPARATUS HAVING CHARGED PARTICLE ENERGY FILTER
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Patent #:
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|
Issue Dt:
|
11/06/1990
|
Application #:
|
07388830
|
Filing Dt:
|
08/03/1989
|
|
Title:
|
VISCOELASTICITY MEASURING APPARATUS
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/07/1991
|
Application #:
|
07420311
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Filing Dt:
|
10/12/1989
|
|
Title:
|
THERMAL ANALYSIS APPARATUS
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|
|
|
|
Patent #:
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|
Issue Dt:
|
12/25/1990
|
Application #:
|
07426292
|
Filing Dt:
|
10/25/1989
|
|
Title:
|
COOLING DEVICE OF HEATING FURNACE IN THERMAL ANALYZER
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|
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|
Patent #:
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|
Issue Dt:
|
06/11/1991
|
Application #:
|
07427537
|
Filing Dt:
|
10/27/1989
|
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Title:
|
APPARATUS FOR PREPARATION AND OBSERVATION OF A TOPOGRAPHIC SECTION
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|
Patent #:
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|
Issue Dt:
|
05/03/1994
|
Application #:
|
07433304
|
Filing Dt:
|
11/08/1989
|
|
Title:
|
GRAPH DISPLAY DEVICE
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|
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|
Patent #:
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|
Issue Dt:
|
10/22/1991
|
Application #:
|
07436874
|
Filing Dt:
|
11/15/1989
|
|
Title:
|
FLUORESCENT X-RAY FILM THICKNESS GAUGE
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|
|
|
|
Patent #:
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|
Issue Dt:
|
01/15/1991
|
Application #:
|
07437224
|
Filing Dt:
|
11/16/1989
|
|
Title:
|
AMPLITUDE MEASUREMENT DEVICE FOR VISCOELASTICITY ANALYSIS
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|
|
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|
Patent #:
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|
Issue Dt:
|
07/02/1991
|
Application #:
|
07444716
|
Filing Dt:
|
12/01/1989
|
|
Title:
|
PREPARATION AND OBSERVATION METHOD OF MICRO-SECTION
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|
Patent #:
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|
Issue Dt:
|
06/02/1992
|
Application #:
|
07521331
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Filing Dt:
|
05/09/1990
|
|
Title:
|
AUTOMATIC COOLING SYSTEM
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|
Patent #:
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|
Issue Dt:
|
06/11/1991
|
Application #:
|
07530791
|
Filing Dt:
|
05/30/1990
|
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Title:
|
ELECTRON BEAM DEVICE
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Patent #:
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Issue Dt:
|
08/25/1992
|
Application #:
|
07548671
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Filing Dt:
|
07/05/1990
|
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Title:
|
COMPOSITE SCANNING TUNNELING MICROSCOPE
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Patent #:
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|
Issue Dt:
|
05/26/1992
|
Application #:
|
07557856
|
Filing Dt:
|
07/24/1990
|
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Title:
|
COMPOSITE SCANNING TUNNELLING MICROSCOPE WITH A POSITIONING FUNCTION
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Patent #:
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Issue Dt:
|
05/05/1992
|
Application #:
|
07656848
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Filing Dt:
|
02/19/1991
|
|
Title:
|
CONTROLLING A LIQUID METAL ION SOURCE BY ANALOG FEEDBACK AND DIGITAL CPV CONTROL
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Patent #:
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Issue Dt:
|
09/15/1992
|
Application #:
|
07676447
|
Filing Dt:
|
03/28/1991
|
|
Title:
|
AN ION BEAM PROCESSING APPARATUS AND GAS GUN THEREFOR
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|
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Patent #:
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|
Issue Dt:
|
10/06/1992
|
Application #:
|
07679861
|
Filing Dt:
|
04/03/1991
|
|
Title:
|
METHOD OF STABILIZING OPERATION FOR A LIQUID METAL ION SOURCE
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Patent #:
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Issue Dt:
|
10/13/1992
|
Application #:
|
07748859
|
Filing Dt:
|
08/23/1991
|
|
Title:
|
TENSION TYPE DYNAMIC VISCOELASTICITY MEASURING APPARATUS
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|
Patent #:
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|
Issue Dt:
|
02/22/1994
|
Application #:
|
07774092
|
Filing Dt:
|
10/11/1991
|
|
Title:
|
THERMOMECHANICAL ANALYZER
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|
Patent #:
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|
Issue Dt:
|
02/02/1993
|
Application #:
|
07783047
|
Filing Dt:
|
10/28/1991
|
|
Title:
|
TENSION TYPE DYNAMIC VISCOELASTICITY MEASURING APPARATUS
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|
Patent #:
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|
Issue Dt:
|
06/01/1993
|
Application #:
|
07792276
|
Filing Dt:
|
11/18/1991
|
|
Title:
|
METHOD FOR AUTOMATIC SAMPLE POSITIONING
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|
Patent #:
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|
Issue Dt:
|
03/08/1994
|
Application #:
|
07799060
|
Filing Dt:
|
11/27/1991
|
|
Title:
|
THERMAL ANALYSIS DEVICE
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|
Patent #:
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|
Issue Dt:
|
04/06/1993
|
Application #:
|
07799357
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Filing Dt:
|
11/27/1991
|
|
Title:
|
FURNACE FOR VISCOELASTICITY MEASURING DEVICE WITH C0NCENTRIC GAS COOLING SHIELD
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Patent #:
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|
Issue Dt:
|
06/01/1993
|
Application #:
|
07799833
|
Filing Dt:
|
11/27/1991
|
|
Title:
|
THERMOGRAVIMETRIC APPARATUS
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|
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|
Patent #:
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|
Issue Dt:
|
01/03/1995
|
Application #:
|
07799834
|
Filing Dt:
|
11/27/1991
|
|
Title:
|
WAVEFORM DISPLAY DEVICE
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|
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|
Patent #:
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|
Issue Dt:
|
07/20/1993
|
Application #:
|
07914103
|
Filing Dt:
|
07/16/1992
|
|
Title:
|
HEAT ANALYZER
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|
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|
|
Patent #:
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|
Issue Dt:
|
04/26/1994
|
Application #:
|
07934391
|
Filing Dt:
|
08/25/1992
|
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Title:
|
APPARATUS FOR THERMOGRAVIMETRY
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Patent #:
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Issue Dt:
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12/27/1994
|
Application #:
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07984921
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Filing Dt:
|
12/04/1992
|
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Title:
|
ANALYSIS OF INTEGRATED CIRCUIT OPERABILITY USING A FOCUSED ION BEAM
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Patent #:
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Issue Dt:
|
04/11/1995
|
Application #:
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08036449
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Filing Dt:
|
03/24/1993
|
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Title:
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METHOD FOR CORRECTING A PATTERNED FILM USING AN ION BEAM
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Patent #:
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Issue Dt:
|
03/29/1994
|
Application #:
|
08044363
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Filing Dt:
|
04/07/1993
|
|
Title:
|
FLUORESCENT X-RAY FILM THICKNESS MEASURING APPARATUS
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|
Patent #:
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Issue Dt:
|
08/02/1994
|
Application #:
|
08045422
|
Filing Dt:
|
04/13/1993
|
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Title:
|
INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY DEVICE
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Patent #:
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Issue Dt:
|
02/14/1995
|
Application #:
|
08057766
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Filing Dt:
|
05/07/1993
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Title:
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PARALLEL PLATE DIELECTRIC CONSTANT MEASURING APPARATUS HAVING MEANS FOR PREVENTING SAMPLE DEFORMATION
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Patent #:
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Issue Dt:
|
06/28/1994
|
Application #:
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08057767
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Filing Dt:
|
05/07/1993
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Title:
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SCANNING PROBE MICROSCOPE HAVING A DIRECTIONAL COUPLER AND A Z-DIRECTION DISTANCE ADJUSTING PIEZOELECTRIC ELEMENT
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Patent #:
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Issue Dt:
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09/06/1994
|
Application #:
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08059392
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Filing Dt:
|
05/11/1993
|
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Title:
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DIELECTRIC CONSTANT-MEASURING APPARATUS
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Patent #:
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Issue Dt:
|
09/05/1995
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Application #:
|
08065054
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Filing Dt:
|
05/24/1993
|
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Title:
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APPARATUS FOR THERMAL ANALYSIS
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Patent #:
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Issue Dt:
|
12/19/1995
|
Application #:
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08118820
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Filing Dt:
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09/10/1993
|
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Title:
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INDUCTIVELY COUPLED PLASMA MASS SPECTROMETER
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Patent #:
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Issue Dt:
|
12/06/1994
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Application #:
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08134846
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Filing Dt:
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10/12/1993
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Title:
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THERMOMECHANICAL ANALYZER
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Patent #:
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Issue Dt:
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09/26/1995
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Application #:
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08135483
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Filing Dt:
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10/13/1993
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Title:
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DYNAMIC VISCOELASTICITY APPARATUS
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Patent #:
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Issue Dt:
|
08/22/1995
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Application #:
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08158739
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Filing Dt:
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11/30/1993
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Title:
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METHOD OF AUTOMATICALLY SETTING COORDINATE CONVERSION FACTOR
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Patent #:
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Issue Dt:
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08/08/1995
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Application #:
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08174292
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Filing Dt:
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12/28/1993
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Title:
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SCANNING PROBE MICROSCOPE
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Patent #:
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Issue Dt:
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11/14/1995
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Application #:
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08184027
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Filing Dt:
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01/21/1994
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Title:
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THERMOGRAVIMETRIC APPARATUS WITH A BALANCE ARM VIBRATING FUNCTION
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Patent #:
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Issue Dt:
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12/19/1995
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Application #:
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08184122
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Filing Dt:
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01/21/1994
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Title:
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PARTICLE ANALYSIS METHOD
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Patent #:
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Issue Dt:
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05/23/1995
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Application #:
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08184562
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Filing Dt:
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01/21/1994
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Title:
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AUTOMATIC COOLING APPARATUS
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Patent #:
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Issue Dt:
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08/08/1995
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Application #:
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08186137
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Filing Dt:
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01/24/1994
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Title:
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SURFACE ANALYZING AND PROCESSING APPARATUS
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Patent #:
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Issue Dt:
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06/11/1996
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Application #:
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08191863
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Filing Dt:
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02/04/1994
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Title:
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FOCUSED CHARGED BEAM APPARATUS, AND ITS PROCESSING AND OBSERVATION METHOD
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Patent #:
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Issue Dt:
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05/09/2000
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Application #:
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08194369
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Filing Dt:
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02/09/1994
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Title:
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COATING THICKNESS GAUGE BY X-RAY FLUORESCENCE
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Patent #:
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Issue Dt:
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01/16/1996
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Application #:
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08199446
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Filing Dt:
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02/22/1994
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Title:
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SAMPLE HOLDING APPARATUS
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Patent #:
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Issue Dt:
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08/22/1995
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Application #:
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08201272
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Filing Dt:
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02/24/1994
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Title:
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THERMAL ANALYSER
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Patent #:
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Issue Dt:
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11/12/1996
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Application #:
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08204468
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Filing Dt:
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03/01/1994
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Title:
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FOCUSED ION BEAM APPARATUS AND METHOD
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Patent #:
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Issue Dt:
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06/20/1995
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Application #:
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08208009
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Filing Dt:
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03/09/1994
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Title:
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INDUCTIVE PLASMA MASS SPECTROMETER
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Patent #:
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Issue Dt:
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02/06/1996
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Application #:
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08208145
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Filing Dt:
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03/10/1994
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Title:
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MICROELECTRONIC PROCESSING MACHINE
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Patent #:
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Issue Dt:
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06/13/1995
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Application #:
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08210387
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Filing Dt:
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03/18/1994
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Title:
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METHOD OF FINDING THE CENTER OF A BAND-SHAPED REGION
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Patent #:
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Issue Dt:
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06/13/1995
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Application #:
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08217747
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Filing Dt:
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03/25/1994
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Title:
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AN ALIGNMENT ASSEMBLY FOR ALIGNING SPRING ELEMENT WITH A LASER BEAM IN A PROBE MICROSCOPE
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Patent #:
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Issue Dt:
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04/09/1996
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Application #:
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08220103
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Filing Dt:
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03/30/1994
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Title:
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SCANNING TYPE PROBE MICROSCOPE
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Patent #:
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Issue Dt:
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10/10/1995
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Application #:
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08220598
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Filing Dt:
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03/31/1994
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Title:
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ANALYZING METHOD FOR FOREIGN MATTER STATES
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Patent #:
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Issue Dt:
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08/01/1995
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Application #:
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08272545
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Filing Dt:
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07/11/1994
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Title:
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FOCUSED ION BEAM APPARATUS
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Patent #:
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Issue Dt:
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02/04/1997
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08311739
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09/23/1994
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Title:
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THERMAL ANALYSIS INSTRUMENT
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Issue Dt:
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01/09/1996
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08321676
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10/12/1994
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Title:
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ELECTRON BEAM MICROANALYZER
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Issue Dt:
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05/28/2002
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08351093
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11/30/1994
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MICROMACHINING METHOD FOR WORKPIECE OBSERVATION
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Issue Dt:
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07/30/1996
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08412665
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03/29/1995
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Title:
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MICRO AREA ANALYZING METHOD
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Issue Dt:
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01/27/1998
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08552548
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11/03/1995
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Title:
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METHOD FOR MEASURING THE COEFFICIENT OF HEAT CONDUCTIVITY OF A SAMPLE
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Issue Dt:
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09/23/1997
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08561194
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11/21/1995
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Title:
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HUMIDITY CONTROL THERMAL ANALYZER
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Issue Dt:
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07/22/1997
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08564747
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11/29/1995
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Title:
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AN OPTICAL SCANNING SYSTEM UTILIZING AN ATOMIC FORCE MICROSCOPE AND AN OPTICAL MICROSCOPE
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03/02/1999
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08600141
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02/12/1996
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Title:
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ANALYZING METHOD AND APPARATUS FOR MINUTE FOREIGN SUBSTANCES, AND MANUFACTURING METHODS FOR MANUFACTURING SEMICONDUCTOR DEVICE AND LIQUID CRYSTAL DISPLAY DEVICE USING THE SAME
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Issue Dt:
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09/26/2000
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08600142
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02/12/1996
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Title:
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METHOD FOR ANALYZING MINUTE FOREIGN SUBSTANCE ELEMENTS
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Patent #:
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Issue Dt:
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10/27/1998
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Application #:
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08678045
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Filing Dt:
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07/10/1996
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Title:
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THERMOMECHANICAL ANALYZER EQUIPPED WITH A THERMOGRAVIMETRY FUNCTION
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Patent #:
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Issue Dt:
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02/17/1998
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Application #:
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08688497
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07/30/1996
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Title:
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SAMPLE CONTAINER SEALER HAVING FUNCTION OF SETTING LOAD
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Issue Dt:
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02/29/2000
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Application #:
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08724996
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10/03/1996
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Title:
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PLASMA ION MASS ANALYZING APPARATUS
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Patent #:
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Issue Dt:
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11/09/1999
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Application #:
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08746794
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11/15/1996
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Title:
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METHOD OF DETECTING PLASTIC DEFORMATION IN STEEL USING A DIFFERENTIAL TYPE MAGNETIC FIELD SENSOR
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Patent #:
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Issue Dt:
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09/08/1998
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Application #:
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08856605
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05/15/1997
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Title:
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PLASMA ION SOURCE MASS ANALYZER
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Patent #:
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Issue Dt:
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05/02/2000
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Application #:
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08896664
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Filing Dt:
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07/18/1997
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Title:
|
THERMOGRAVIMETRIC INSTRUMENT
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Patent #:
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Issue Dt:
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09/12/2000
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Application #:
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08922892
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Filing Dt:
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09/03/1997
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Title:
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ION BEAM WORKING APPARATUS
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Patent #:
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Issue Dt:
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10/19/1999
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Application #:
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08923562
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Filing Dt:
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09/04/1997
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Title:
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FOCUSED ION BEAM OPTICAL AXIS ADJUSTMENT METHOD AND FOCUSED ION BEAM APPARATUS
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Patent #:
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Issue Dt:
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06/29/1999
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Application #:
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08925976
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Filing Dt:
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09/09/1997
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Title:
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FOCUSED ION BEAM OPTICAL AXIS ADJUSTMENT METHOD AND FOCUSED ION BEAM APPARATUS
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Patent #:
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Issue Dt:
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11/28/2000
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Application #:
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09064332
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Filing Dt:
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04/22/1998
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Title:
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FLUORESCENT X-RAY SPECTROSCOPE
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Patent #:
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Issue Dt:
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07/03/2001
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Application #:
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09187938
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Filing Dt:
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11/06/1998
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Title:
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ANALYZING METHOD AND APPARATUS FOR MINUTE FOREIGN SUBSTANCES, AND MANUFACTURING METHODS FOR MANUFACTURING SEMICONDUCTOR DEVICE AND LIQUID CRYSTAL DISPLAY DEVICE USING THE SAME
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Patent #:
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Issue Dt:
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04/02/2002
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Application #:
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09324264
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Filing Dt:
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06/02/1999
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Title:
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FOCUSED ION BEAM PROCESSING APPARATUS
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Patent #:
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Issue Dt:
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07/29/2003
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Application #:
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09517673
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Filing Dt:
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03/02/2000
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Title:
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THERMO-MECHANICAL ANALYZER
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Patent #:
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Issue Dt:
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03/12/2002
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Application #:
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09553339
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Filing Dt:
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04/20/2000
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Title:
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Method and apparatus for analyzing minute foreign substance, and process for semiconductor elements or liquid crystal display elements by use thereof
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Patent #:
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Issue Dt:
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09/16/2003
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Application #:
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10171797
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Filing Dt:
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06/13/2002
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Publication #:
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Pub Dt:
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01/09/2003
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Title:
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AUTOMATIC FOCUSING SYSTEM FOR SCANNING ELECTRON MICROSCOPE EQUIPPED WITH LASER DEFECT DETECTION FUNCTION
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