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Total properties:
17
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Patent #:
|
|
Issue Dt:
|
11/03/1998
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Application #:
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08622521
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Filing Dt:
|
03/25/1996
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Title:
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APPARATUS AND METHOD TO PROVIDE SECURITY FOR A KEYPAD PROCESSOR OF A TRANSACTION TERMINAL
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|
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Patent #:
|
|
Issue Dt:
|
09/25/2001
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Application #:
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09186494
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Filing Dt:
|
11/04/1998
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Title:
|
REMOVING NOISE CAUSED BY ARTIFAVTS FROM A DIGITAL IMAGE SIGNAL
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|
|
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Patent #:
|
|
Issue Dt:
|
12/05/2000
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Application #:
|
09186495
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Filing Dt:
|
11/04/1998
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Title:
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SAMPLE SHAPE DETERMINATION BY MEASUREMENT OF SURFACE SLOPE WITH A SCANNING ELECTRON MICROSCOPE
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Patent #:
|
|
Issue Dt:
|
03/26/2002
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Application #:
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09191102
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Filing Dt:
|
11/12/1998
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Title:
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MAGNETIC LENS FOR FOCUSING A CHARGED PARTICLE BEAM
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Patent #:
|
|
Issue Dt:
|
09/02/2003
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Application #:
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09648262
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Filing Dt:
|
08/25/2000
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Title:
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OVERLAY REGISTRATION ERROR MEASUREMENT MADE SIMULTANEOUSLY FOR MORE THAN TWO SEMICONDUCTOR WAFER LAYERS
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|
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Patent #:
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|
Issue Dt:
|
03/04/2003
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Application #:
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09717663
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Filing Dt:
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11/21/2000
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Title:
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TECHNIQUE FOR MANUFACTURING AN ELECTROSTATIC ELEMENT FOR STEERING A CHARGED PARTICLE BEAM
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|
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Patent #:
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Issue Dt:
|
09/23/2003
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Application #:
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09734409
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Filing Dt:
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12/11/2000
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Publication #:
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Pub Dt:
|
06/13/2002
| | | | |
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Title:
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SPLIT MAGNETIC LENS FOR CONTROLLING A CHARGED PARTICLE BEAM
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|
|
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Patent #:
|
|
Issue Dt:
|
03/11/2003
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Application #:
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09957870
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Filing Dt:
|
09/21/2001
|
|
Title:
|
REMOVING NOISE CAUSED BY ARTIFACTS FROM A DIGITAL IMAGE SIGNAL
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|
|
|
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Patent #:
|
|
Issue Dt:
|
04/06/2004
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Application #:
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09994563
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Filing Dt:
|
11/27/2001
|
|
Title:
|
REDUCTION OF ABERRATIONS PRODUCED BY WIEN FILTER IN A SCANNING ELECTRON MICROSCOPE AND THE LIKE
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|
|
|
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Patent #:
|
|
Issue Dt:
|
08/30/2005
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Application #:
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10007484
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Filing Dt:
|
11/07/2001
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Publication #:
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|
Pub Dt:
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11/18/2004
| | | | |
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Title:
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VIBRATION-ISOLATING COUPLING INCLUDING AN ELASTOMER DIAPHRAGM FOR SCANNING ELECTRON MICROSCOPE AND THE LIKE
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|
|
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Patent #:
|
NONE
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Issue Dt:
|
|
Application #:
|
10007618
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Filing Dt:
|
11/07/2001
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|
Publication #:
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Pub Dt:
|
05/08/2003
| | | | |
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Title:
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System and method for inhibiting motion of semiconductor wafers in a variable-pressure chamber
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Patent #:
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Issue Dt:
|
07/15/2003
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Application #:
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10010321
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Filing Dt:
|
11/08/2001
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|
Title:
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WIEN FILTER FOR USE IN A SCANNING ELECTRON MICROSCOPE OR THE LIKE
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
01/20/2004
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Application #:
|
10011007
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Filing Dt:
|
11/08/2001
|
|
Title:
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FIXTURE FOR ASSEMBLING PARTS OF A DEVICE SUCH AS A WIEN FILTER
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|
|
|
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Patent #:
|
|
Issue Dt:
|
04/06/2004
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Application #:
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10136692
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Filing Dt:
|
04/30/2002
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|
Publication #:
|
|
Pub Dt:
|
10/30/2003
| | | | |
|
Title:
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BEAM ALIGNMENT IN A LOWER COLUMN OF A SCANNING ELECTRON MICROSCOPE OR THE LIKE
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|
|
|
|
Patent #:
|
|
Issue Dt:
|
11/30/2004
|
Application #:
|
10163917
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Filing Dt:
|
06/06/2002
|
|
Publication #:
|
|
Pub Dt:
|
12/11/2003
| | | | |
|
Title:
|
FIXTURE FOR MICROSCOPE COMPONENT ALIGNMENT
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|
|
|
|
Patent #:
|
NONE
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Issue Dt:
|
|
Application #:
|
10272763
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Filing Dt:
|
10/17/2002
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|
Publication #:
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|
Pub Dt:
|
04/22/2004
| | | | |
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Title:
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Apparatus and method for image optimization of samples in a scanning electron microscope
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|
|
|
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Patent #:
|
|
Issue Dt:
|
01/31/2006
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Application #:
|
10985144
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Filing Dt:
|
11/10/2004
|
|
Publication #:
|
|
Pub Dt:
|
05/12/2005
| | | | |
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Title:
|
APPARATUS AND METHOD FOR IMAGE OPTIMIZATION OF SAMPLES IN A SCANNING ELECTRON MICROSCOPE
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|
