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Reel/Frame:016647/0193   Pages: 8
Recorded: 08/18/2005
Attorney Dkt #:RECP-111US
Conveyance: CORRECTION TO OUR ERROR
Total properties: 1
1
Patent #:
Issue Dt:
05/20/2008
Application #:
10711424
Filing Dt:
09/17/2004
Publication #:
Pub Dt:
04/21/2005
Title:
APPARATUS FOR MEASURING FEATURE WIDTHS ON MASKS FOR THE SEMICONDUCTOR INDUSTRY
Assignors
1
Exec Dt:
12/01/2004
2
Exec Dt:
12/20/2004
3
Exec Dt:
11/29/2004
4
Exec Dt:
12/07/2004
Assignees
1
ERNST-LEITZ-STRASSE 17-37
WETZLAR, GERMANY D-35578
2
WILDERMUTHSTRASSE 88
MUENCHEN, GERMANY D-80993
Correspondence name and address
ROBERT P. SIMPSON, ESQ.
SIMPSON & SIMPSON, PLLC
5555 MAIN STREET
WILLIAMSVILLE, NY 14221-5406

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