Patent Assignment Details
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Reel/Frame: | 016647/0193 | |
| Pages: | 8 |
| | Recorded: | 08/18/2005 | | |
Attorney Dkt #: | RECP-111US |
Conveyance: | CORRECTION TO OUR ERROR |
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Total properties:
1
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Patent #:
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Issue Dt:
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05/20/2008
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Application #:
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10711424
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Filing Dt:
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09/17/2004
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Publication #:
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Pub Dt:
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04/21/2005
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Title:
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APPARATUS FOR MEASURING FEATURE WIDTHS ON MASKS FOR THE SEMICONDUCTOR INDUSTRY
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Assignees
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ERNST-LEITZ-STRASSE 17-37 |
WETZLAR, GERMANY D-35578 |
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WILDERMUTHSTRASSE 88 |
MUENCHEN, GERMANY D-80993 |
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Correspondence name and address
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ROBERT P. SIMPSON, ESQ.
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SIMPSON & SIMPSON, PLLC
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5555 MAIN STREET
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WILLIAMSVILLE, NY 14221-5406
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