Patent Assignment Details
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Reel/Frame: | 016720/0448 | |
| Pages: | 3 |
| | Recorded: | 06/24/2005 | | |
Attorney Dkt #: | 04329.3538 |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/18/2008
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Application #:
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11110915
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Filing Dt:
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04/21/2005
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Publication #:
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Pub Dt:
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10/27/2005
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Title:
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METHOD OF MANUFACTURING PHOTO MASK, MASK PATTERN SHAPE EVALUATION APPARATUS, METHOD OF JUDGING PHOTO MASK DEFECT CORRECTED PORTION, PHOTO MASK DEFECT CORRECTED PORTION JUDGMENT APPARATUS, AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
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Assignee
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1-1, SHIBAURA 1-CHOME, MINATO-KU |
TOKYO 105-8001, JAPAN |
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Correspondence name and address
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FINNEGAN, HENDERSON, FARABOW, ET AL.
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ERNEST F. CHAPMAN
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901 NEW YORK AVENUE, N.W.
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WASHINGTON, DC 20001-4413
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