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Patent Assignment Details
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Reel/Frame:016954/0304   Pages: 5
Recorded: 09/07/2005
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
06/10/2008
Application #:
11149176
Filing Dt:
06/10/2005
Publication #:
Pub Dt:
12/22/2005
Title:
DEVICE FOR INSPECTING MICRO STRUCTURE, METHOD FOR INSPECTING MICRO STRUCTURE AND PROGRAM FOR INSPECTING MICRO STRUCTURE
Assignors
1
Exec Dt:
08/01/2005
2
Exec Dt:
08/08/2005
3
Exec Dt:
08/08/2005
4
Exec Dt:
08/08/2005
Assignees
1
1-22-1-103, WAKABA, SHINJUKU
TOKYO 160-0011, JAPAN
2
3-6, AKASAKA 5-CHOME, MINATO-KU
TOKYO 107-8481, JAPAN
Correspondence name and address
FINNEGAN, HENDERSON, FARABOW, GARRETT
& DUNNER, L.L.P.
DAVID W. HILL
901 NEW YORK AVENUE, NW
WASHINGTON, D.C. 20001-4413

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