Patent Assignment Details
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| Reel/Frame: | 016999/0865 | |
| Pages: | 6 |
| | Recorded: | 09/14/2005 | | |
| Attorney Dkt #: | 16869S-032110US |
| Conveyance: | CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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02/14/2006
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Application #:
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10933977
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Filing Dt:
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09/03/2004
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Publication #:
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Pub Dt:
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02/03/2005
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Title:
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METHOD AND ITS APPARATUS FOR INSPECTING PARTICLES OR DEFECTS OF A SEMICONDUCTOR DEVICE
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Assignee
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| 16-3, HIGASHI 3-CHOME, SHIBUYA-KU |
| TOKYO, JAPAN |
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Correspondence name and address
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GEORGE B.F. YEE
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TOWNSEND AND TOWNSEND AND CREW LLP
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TWO EMBARCADERO CENTER
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EIGHTH FLOOR
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SAN FRANCISCO, CA 94111-3834
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