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Patent Assignment Details

NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Total properties: 10

Patent #:	6830650	Issue Dt:	12/14/2004	Application #:	10194526	Filing Dt:	07/12/2002
Publication #:	US20040007326	Pub Dt:	01/15/2004
Title:	WAFER PROBE FOR MEASURING PLASMA AND SURFACE CHARACTERISTICS IN PLASMA PROCESSING ENVIROMENTS

Patent #:	6777288	Issue Dt:	08/17/2004	Application #:	10290138	Filing Dt:	11/06/2002
Title:	VERTICAL MOS TRANSISTOR

Patent #:	6902646	Issue Dt:	06/07/2005	Application #:	10640892	Filing Dt:	08/14/2003
Publication #:	US20050034811	Pub Dt:	02/17/2005
Title:	SENSOR ARRAY FOR MEASURING PLASMA CHARACTERISTICS IN PLASMA PROCESSING ENVIRONMENTS

Patent #:	NONE	Issue Dt:		Application #:	10815124	Filing Dt:	03/31/2004
Publication #:	US20050217796	Pub Dt:	10/06/2005
Title:	Techniques for packaging and encapsulating components of diagnostic plasma measurement devices

Patent #:	NONE	Issue Dt:		Application #:	10875954	Filing Dt:	06/24/2004
Publication #:	US20050284570	Pub Dt:	12/29/2005
Title:	Diagnostic plasma measurement device having patterned sensors and features

Patent #:	NONE	Issue Dt:		Application #:	10933167	Filing Dt:	09/02/2004
Publication #:	US20060043063	Pub Dt:	03/02/2006
Title:	Electrically floating diagnostic plasma probe with ion property sensors

Patent #:	NONE	Issue Dt:		Application #:	10951084	Filing Dt:	09/27/2004
Publication #:	US20050039852	Pub Dt:	02/24/2005
Title:	Wafer probe for measuring plasma and surface characteristics in plasma processing enviroments

Patent #:	7192505	Issue Dt:	03/20/2007	Application #:	10951162	Filing Dt:	09/27/2004
Publication #:	US20050034812	Pub Dt:	02/17/2005
Title:	WAFER PROBE FOR MEASURING PLASMA AND SURFACE CHARACTERISTICS IN PLASMA PROCESSING ENVIRONMENTS

Patent #:	NONE	Issue Dt:		Application #:	11047256	Filing Dt:	01/31/2005
Publication #:	US20060171848	Pub Dt:	08/03/2006
Title:	Diagnostic plasma sensors for endpoint and end-of-life detection

Patent #:	8545669	Issue Dt:	10/01/2013	Application #:	11066520	Filing Dt:	02/25/2005
Publication #:	US20050151544	Pub Dt:	07/14/2005
Title:	SENSOR ARRAY FOR MEASURING PLASMA CHARACTERISTICS IN PLASMA PROCESSING ENVIRONMENTS

Assignor

Exec Dt:

12/09/2005

Assignee

3964 RIVERMARK PLAZA #207

SANTA CLARA, CALIFORNIA 95054

Correspondence name and address
	JOSEPH R. TIANO
	P.O. BOX 190187
	SAN FRANCISCO, CA 94119-0187

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