Patent Assignment Details
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| Reel/Frame: | 017118/0648 | |
| Pages: | 5 |
| | Recorded: | 10/17/2005 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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03/16/2010
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Application #:
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11187609
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Filing Dt:
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07/22/2005
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Publication #:
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Pub Dt:
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02/02/2006
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Title:
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TEST STRUCTURES AND METHODS FOR MONITORING OR CONTROLLING A SEMICONDUCTOR FABRICATION PROCESS
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Assignee
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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Correspondence name and address
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DAFFER MCDANIEL, LLP
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P.O. BOX 684908
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AUSTIN, TX 78768-4908
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