Patent Assignment Details
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| Reel/Frame: | 017143/0063 | |
| Pages: | 2 |
| | Recorded: | 10/26/2005 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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08/21/2007
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Application #:
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11259191
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Filing Dt:
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10/26/2005
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Publication #:
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Pub Dt:
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04/27/2006
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Title:
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X-RAY THIN FILM INSPECTION APPARATUS AND THIN FILM INSPECTION APPARATUS AND METHOD FOR PATTERNED WAFER
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Assignee
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| 3-9-12, MATSUBARA-CHO |
| AKISHIMA-SHI, TOKYO, 196-8666, JAPAN |
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Correspondence name and address
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C. BRUCE HAMBURG, ESQ.
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JORDAN AND HAMBURG LLP
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CHANIN BUILDING, SUITE 4000
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122 EAST 42ND STREET
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NEW YORK, NEW YORK 10168
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