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Patent Assignment Details
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Reel/Frame:017172/0150   Pages: 3
Recorded: 10/31/2005
Attorney Dkt #:001458.00066
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
11128415
Filing Dt:
05/13/2005
Publication #:
Pub Dt:
02/16/2006
Title:
Rapid X-ray diffraction method for structural analysis of a nano material on a surface or at an interface and for structural analysis of a solid/liquid interface, and apparatus used for the method
Assignor
1
Exec Dt:
09/09/2005
Assignee
1
1-1-1, KOUTO, MIKAZUKI-SHI
SAYO-GUN, HYOGO, JAPAN 679-5198
Correspondence name and address
WILLIAM J. FISHER
BANNER & WITCOFF, LTD.
1001 G STREET, N.W., SUITE 1100
WASHINGTON, DC 20001-4597

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