Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
| Reel/Frame: | 017263/0627 | |
| Pages: | 3 |
| | Recorded: | 02/16/2006 | | |
| Conveyance: | RE-RECORD TO CORRECT ASSIGNEE'S ADDRESS PREVIOUSLY RECORDED R/F 01700/0454 |
|
|
Total properties:
1
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/13/2008
|
Application #:
|
11176300
|
Filing Dt:
|
07/08/2005
|
|
Publication #:
|
|
Pub Dt:
|
01/12/2006
| | | | |
|
Title:
|
SEMICONDUCTOR TESTING APPARATUS AND METHOD OF TESTING SEMICONDUCTOR
|
|
|
Assignee
|
|
|
|
|
| 32-1, ASAHI-CHO 1-CHOME |
| NERIMA-KU, TOKYO 179-0071, JAPAN |
|
|
Correspondence name and address
|
| |
SUGHRUE MION, PLLC
|
| |
2100 PENNSYLVANIA AVENUE, N.W.
|
| |
SUITE 800
|
| |
WASHINGTON, DC 20037
|
Search Results as of:
04/27/2024 02:36 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
