Patent Assignment Details
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| Reel/Frame: | 017382/0117 | |
| Pages: | 2 |
| | Recorded: | 12/16/2005 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/08/2008
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Application #:
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11303191
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Filing Dt:
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12/16/2005
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Publication #:
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Pub Dt:
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05/04/2006
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Title:
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SEMICONDUCTOR TEST APPARATUS AND CONTROL METHOD THEREFOR
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Assignee
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| 1-32-1, ASAHI-CHO, NERIMA-KU |
| TOKYO 179-0071, JAPAN |
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Correspondence name and address
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JONATHAN P. OSHA
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OSHA - LIANG LLP
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1221 MCKINNEY ST., SUITE 2800
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HOUSTON, TX 77010
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