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Patent Assignment Details
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Reel/Frame:017468/0752   Pages: 4
Recorded: 01/17/2006
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
10/18/2005
Application #:
10709236
Filing Dt:
04/23/2004
Publication #:
Pub Dt:
10/28/2004
Title:
METHOD OF MEASURING A GATE CHANNEL LENGTH OF A METAL-OXIDE SEMICONDUCTOR TRANSISTOR
Assignors
1
Exec Dt:
12/13/2005
2
Exec Dt:
12/13/2005
3
Exec Dt:
12/13/2005
4
Exec Dt:
12/13/2005
5
Exec Dt:
12/13/2005
Assignee
1
NO. 3, LI-HSIN ROAD 2, SCIENCE-BASED PARK
HSIN-CHU CITY, TAIWAN R.O.C.
Correspondence name and address
NORTH AMERICA INTELLECTUAL PROPERTY CORP
P.O. BOX 506
MERRIFIELD, VA 22116

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