Total properties:
11
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Patent #:
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Issue Dt:
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08/14/2007
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Application #:
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10908441
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Filing Dt:
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05/12/2005
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Publication #:
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Pub Dt:
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11/16/2006
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Title:
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METHOD FOR TREATING A WAFER EDGE
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Patent #:
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Issue Dt:
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08/22/2006
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Application #:
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10964102
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Filing Dt:
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10/13/2004
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Publication #:
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Pub Dt:
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04/13/2006
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Title:
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MEASURING FLARE IN SEMICONDUCTOR LITHOGRAPHY
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Patent #:
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Issue Dt:
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10/14/2008
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Application #:
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11204692
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Filing Dt:
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08/16/2005
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Publication #:
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Pub Dt:
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02/22/2007
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Title:
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SENSOR DISCRIMINATION APPARATUS, SYSTEM, AND METHOD
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11300147
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Filing Dt:
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12/14/2005
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Publication #:
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Pub Dt:
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06/14/2007
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Title:
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Semiconductor devices and methods of manufacture thereof
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11343052
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Filing Dt:
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01/30/2006
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Publication #:
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Pub Dt:
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08/02/2007
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Title:
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Semiconductor wafer having measurement area feature for determining dielectric layer thickness
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Patent #:
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Issue Dt:
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10/12/2010
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Application #:
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11346064
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Filing Dt:
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02/02/2006
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Publication #:
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Pub Dt:
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08/02/2007
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Title:
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ELECTRICAL IDLE DETECTION CIRCUIT INCLUDING INPUT SIGNAL RECTIFIER
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Patent #:
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Issue Dt:
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04/29/2008
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Application #:
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11348428
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Filing Dt:
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02/06/2006
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Publication #:
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Pub Dt:
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08/09/2007
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Title:
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METHODS OF FORMING DUAL-DAMASCENE INTERCONNECT STRUCTURES ON SEMICONDUCTOR SUBSTRATES USING MULTIPLE PLANARIZATION LAYERS HAVING DIFFERENT POROSITY CHARACTERISTICS
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Patent #:
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Issue Dt:
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03/16/2010
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Application #:
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11367247
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Filing Dt:
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03/03/2006
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Publication #:
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Pub Dt:
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11/30/2006
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Title:
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DEEP TRENCH ISOLATION STRUCTURES AND METHODS OF FORMATION THEREOF
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Patent #:
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Issue Dt:
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04/22/2008
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Application #:
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11385340
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Filing Dt:
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03/21/2006
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Publication #:
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Pub Dt:
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09/27/2007
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Title:
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PARALLEL READ FOR FRONT END COMPRESSION MODE
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11385539
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Filing Dt:
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03/21/2006
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Publication #:
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Pub Dt:
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09/27/2007
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Title:
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Multiple banks read and data compression for back end test
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11390696
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Filing Dt:
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03/28/2006
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Publication #:
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Pub Dt:
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10/11/2007
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Title:
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Process control systems and methods
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