Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Reel/Frame: | 017551/0118 | |
| Pages: | 3 |
| | Recorded: | 02/08/2006 | | |
Attorney Dkt #: | 267025US26 |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
Total properties:
1
|
|
Patent #:
|
|
Issue Dt:
|
05/27/2008
|
Application #:
|
11349276
|
Filing Dt:
|
02/08/2006
|
Publication #:
|
|
Pub Dt:
|
08/10/2006
| | | | |
Title:
|
TEMPERATURE/THICKNESS MEASURING APPARATUS, TEMPERATURE/THICKNESS MEASURING METHOD, TEMPERATURE/THICKNESS MEASURING SYSTEM, CONTROL SYSTEM AND CONTROL METHOD
|
|
Assignee
|
|
|
3-6, AKASAKA 5-CHOME, MINATO-KU |
TOKYO 107-8481, JAPAN |
|
Correspondence name and address
|
|
OBLON, SPOVAK, MCCLELLAND, ET AL
|
|
STEVEN P. WEIHROUCH
|
|
1940 DUKE STREET
|
|
ALEXANDRIA, VA. 22314
|
Search Results as of:
05/02/2024 04:53 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|