Patent Assignment Details
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| Reel/Frame: | 017650/0015 | |
| Pages: | 3 |
| | Recorded: | 03/06/2006 | | |
| Attorney Dkt #: | 384848020US |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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09/11/2007
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Application #:
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11368576
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Filing Dt:
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03/06/2006
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Publication #:
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Pub Dt:
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09/06/2007
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Title:
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MEMORY TRANSISTOR GATE OXIDE STRESS RELEASE AND IMPROVED RELIABILITY
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Assignee
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| 3333 OCTAVIUS DRIVE, SUITE 101 |
| SANTA CLARA, CALIFORNIA 95054 |
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Correspondence name and address
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CHUN M. NG
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PERKINS COIE LLP
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P.O. BOX 1247
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SEATTLE, WA 98111-1247
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