Patent Assignment Details
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| Reel/Frame: | 017672/0795 | |
| Pages: | 4 |
| | Recorded: | 03/07/2006 | | |
| Conveyance: | CORRECTIVE ASSIGNMENT TO CORRECT THE NAME AND ADDRESS OF THE ASSIGNEE PREVIOUSLY RECORDED AT REEL 017172 FRAME 0150. ASSIGNOR CONFIRMS THE ASSIGNMENT. |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11128415
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Filing Dt:
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05/13/2005
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Publication #:
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Pub Dt:
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02/16/2006
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Title:
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Rapid X-ray diffraction method for structural analysis of a nano material on a surface or at an interface and for structural analysis of a solid/liquid interface, and apparatus used for the method
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Assignee
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| 1-1-1, KOUTO, MIKAZUKI-CHO |
| SAYO-GUN, HYOGO 376-5198, JAPAN |
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Correspondence name and address
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WILLIAM J. FISHER
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BANNER & WITCOFF, LTD.
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1001 G STREET, N.W., SUITE 1100
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WASHINGTON, D.C. 20001-4597
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