Patent Assignment Details
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| Reel/Frame: | 017825/0336 | |
| Pages: | 2 |
| | Recorded: | 04/24/2006 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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03/02/2010
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Application #:
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10544178
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Filing Dt:
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04/24/2006
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Publication #:
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Pub Dt:
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11/09/2006
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Title:
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METHOD FOR INSPECTION, PROCESS FOR MAKING ANALYTIC PIECE, METHO FOR ANALYSIS, ANALYZER, PROCESS FOR PRODUCING SOI WAFER, AND SOI WAFER
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Assignee
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| 2-1, SHIBAURA 1-CHOME |
| MINATO-KU, TOKYO, JAPAN |
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Correspondence name and address
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PILLSBURY WINTHROP SHAW PITTMAN LLP
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P.O. BOX 10500
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1650 TYSONS BLVD.
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MCLEAN, VA 22102
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