Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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Reel/Frame: | 017846/0823 | |
| Pages: | 4 |
| | Recorded: | 06/29/2006 | | |
Attorney Dkt #: | 20820/8202169-000 |
Conveyance: | CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). |
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Total properties:
8
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Patent #:
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Issue Dt:
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09/11/2007
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Application #:
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10475559
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Filing Dt:
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10/21/2003
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Publication #:
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Pub Dt:
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07/15/2004
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Title:
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ILLUMINATING DEVICE
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Patent #:
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Issue Dt:
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07/19/2005
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Application #:
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10633222
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Filing Dt:
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08/01/2003
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Publication #:
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Pub Dt:
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02/12/2004
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Title:
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COORDINATE MEASURING STAGE
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Patent #:
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Issue Dt:
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09/13/2005
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Application #:
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10672048
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Filing Dt:
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09/26/2003
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Publication #:
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Pub Dt:
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04/15/2004
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Title:
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CRITICAL DIMENSION MEASURING INSTRUMENT
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10729588
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Filing Dt:
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12/05/2003
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Publication #:
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Pub Dt:
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06/24/2004
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Title:
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Method and microscope for detecting images of an object
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11037668
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Filing Dt:
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01/18/2005
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Publication #:
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Pub Dt:
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06/09/2005
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Title:
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Apparatus for wafer inspection
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Patent #:
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Issue Dt:
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09/02/2008
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Application #:
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11127002
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Filing Dt:
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05/11/2005
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Publication #:
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Pub Dt:
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11/17/2005
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Title:
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MEASURING INSTRUMENT AND METHOD FOR OPERATING A MEASURING INSTRUMENT FOR OPTICAL INSPECTION OF AN OBJECT
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11153294
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Filing Dt:
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06/15/2005
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Publication #:
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Pub Dt:
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12/22/2005
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Title:
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Method and system for inspecting a wafer
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11153646
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Filing Dt:
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06/15/2005
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Publication #:
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Pub Dt:
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12/22/2005
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Title:
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Method and system for inspecting a wafer WITH TELECENTRIC ILLUMINATION
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Assignee
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ERNST-LEITZ-STRASSE 17-37 |
WETZLAR, GERMANY 35578 |
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Correspondence name and address
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ERIK R. SWANSON
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P.O. BOX 5257
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NEW YORK, NY 10150-5257
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