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Reel/Frame:017851/0643   Pages: 4
Recorded: 05/04/2006
Attorney Dkt #:283856US8CONT
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
04/22/2008
Application #:
11317286
Filing Dt:
12/27/2005
Publication #:
Pub Dt:
08/24/2006
Title:
METHOD FOR DETERMINING DETERIORATION OF ACCUMULATOR BATTERY, METHOD FOR MEASURING INTERNAL IMPEDANCE OF SECONDARY BATTERY, EQUIPMENT FOR MEASURING INTERNAL IMPEDANCE OF SECONDARY BATTERY, EQUIPMENT FOR DETERMINING DETERIORATION OF SECONDARY BATTERY, AND POWER SUPPL
Assignors
1
Exec Dt:
01/27/2006
2
Exec Dt:
01/27/2006
3
Exec Dt:
01/27/2006
4
Exec Dt:
01/27/2006
5
Exec Dt:
01/27/2006
6
Exec Dt:
01/27/2006
7
Exec Dt:
01/27/2006
8
Exec Dt:
01/27/2006
Assignee
1
2-6-1, MARUNOUCHI, CHIYODA-KU
TOKYO 100-8322, JAPAN
Correspondence name and address
OBLON, SPIVAK, MCCLELLAND, MAIER & NEUST
1940 DUKE STREET
ALEXANDRIA, VA 22314

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