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Patent Assignment Details
NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:018026/0297   Pages: 6
Recorded: 07/20/2006
Attorney Dkt #:20820/8202169-000
Conveyance: CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNOR PREVIOUSLY RECORDED ON REEL 017846 FRAME 0823. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME
Total properties: 7
1
Patent #:
Issue Dt:
09/11/2007
Application #:
10475559
Filing Dt:
10/21/2003
Publication #:
Pub Dt:
07/15/2004
Title:
ILLUMINATING DEVICE
2
Patent #:
Issue Dt:
07/19/2005
Application #:
10633222
Filing Dt:
08/01/2003
Publication #:
Pub Dt:
02/12/2004
Title:
COORDINATE MEASURING STAGE
3
Patent #:
Issue Dt:
09/13/2005
Application #:
10672048
Filing Dt:
09/26/2003
Publication #:
Pub Dt:
04/15/2004
Title:
CRITICAL DIMENSION MEASURING INSTRUMENT
4
Patent #:
NONE
Issue Dt:
Application #:
10729588
Filing Dt:
12/05/2003
Publication #:
Pub Dt:
06/24/2004
Title:
Method and microscope for detecting images of an object
5
Patent #:
NONE
Issue Dt:
Application #:
11037668
Filing Dt:
01/18/2005
Publication #:
Pub Dt:
06/09/2005
Title:
Apparatus for wafer inspection
6
Patent #:
Issue Dt:
09/02/2008
Application #:
11127002
Filing Dt:
05/11/2005
Publication #:
Pub Dt:
11/17/2005
Title:
MEASURING INSTRUMENT AND METHOD FOR OPERATING A MEASURING INSTRUMENT FOR OPTICAL INSPECTION OF AN OBJECT
7
Patent #:
NONE
Issue Dt:
Application #:
11153646
Filing Dt:
06/15/2005
Publication #:
Pub Dt:
12/22/2005
Title:
Method and system for inspecting a wafer WITH TELECENTRIC ILLUMINATION
Assignor
1
Exec Dt:
06/02/2006
Assignee
1
ERNST-LEITZ-STRASSE 17-37
WETZLER, GERMANY 35578
Correspondence name and address
ERIK R. SWANSON
DARBY & DARBY P.C.
P.O. BOX 5257
NEW YORK, NEW YORK 10150-5257

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