Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 018033/0036 | |
| Pages: | 2 |
| | Recorded: | 06/26/2006 | | |
| Attorney Dkt #: | 212/839 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11393041
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Filing Dt:
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03/29/2006
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Publication #:
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Pub Dt:
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10/11/2007
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Title:
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Devices and methods for measuring wafer characteristics during semiconductor wafer polishing
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Assignee
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| 825 BUCKLEY ROAD |
| SAN LUIS OBISPO, CALIFORNIA 93401 |
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Correspondence name and address
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K. DAVID CROCKETT
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CROCKETT & CROCKETT
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24012 CALLE DE LA PLATA
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SUITE 400
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LAGUNA HILLS, CA 92653
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