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Reel/Frame:018062/0580   Pages: 3
Recorded: 08/07/2006
Attorney Dkt #:5589-15200 P1785
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
11420960
Filing Dt:
05/30/2006
Publication #:
Pub Dt:
12/06/2007
Title:
Determining Information about Defects or Binning Defects Detected on a Wafer after an Immersion Lithography Process is Performed on the Wafer
Assignors
1
Exec Dt:
07/11/2006
2
Exec Dt:
07/11/2006
Assignee
1
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondence name and address
DAFFER MCDANIEL, LLP
P.O. BOX 684908
AUSTIN, TX 78768-4908

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