Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 018087/0088 | |
| Pages: | 4 |
| | Recorded: | 07/13/2006 | | |
| Attorney Dkt #: | 384848007US |
| Conveyance: | CORRECTIVE ASSIGNMENT TO CORRECT ASSIGNEE'S NAME AND ADDRESS, PREVIOUSL YRECORDED ON 04-02-03 AT REEL 013940/FRAME 0320 |
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Total properties:
1
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Patent #:
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Issue Dt:
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09/14/2004
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Application #:
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10406406
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Filing Dt:
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04/02/2003
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Title:
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METHOD OF TESTING THE THIN OXIDE OF A SEMICONDUCTOR MEMORY CELL THAT USES BREAKDOWN VOLTAGE
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Assignee
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| 3333 OCTAVIUS DRIVE, SUITE 101 |
| SANTA CLARA, CALIFORNIA 95054 |
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Correspondence name and address
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CHUN M. NG
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PERKINS COIE LLP
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SEATTLE, WA 98111-1247
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