Patent Assignment Details
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Reel/Frame: | 018087/0092 | |
| Pages: | 3 |
| | Recorded: | 07/12/2006 | | |
Conveyance: | CORRECTIVE ASSIGNMENT TO CORRECT ASSIGNEE'S NAME AND ADDRESS, PREVIOUSLY RECORDED ON 03/09/2004 AT REEL 015068 FRAME 0216 |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/18/2006
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Application #:
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10796270
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Filing Dt:
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03/09/2004
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Publication #:
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Pub Dt:
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10/21/2004
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Title:
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METHODS AND CIRCUITS FOR TESTING PROGRAMMABILITY OF A SEMICONDUCTOR MEMORY CELL AND MEMORY ARRAY USING A BREAKDOWN PHENOMENON IN AN ULTRA-THIN DIELECTRIC
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Assignee
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3333 OCTAVIUS DRIVE |
SUITE 101 |
SANTA CLARA, CALIFORNIA 95054 |
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Correspondence name and address
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CHUN M. NG
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PERKINS COIE LLP
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P.O. BOX 1247
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SEATTLE, WA 98111-1247
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