Patent Assignment Details
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| Reel/Frame: | 018118/0993 | |
| Pages: | 3 |
| | Recorded: | 07/21/2006 | | |
| Attorney Dkt #: | 111346142XOO |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/02/2009
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Application #:
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11407905
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Filing Dt:
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04/21/2006
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Publication #:
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Pub Dt:
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12/14/2006
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Title:
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METHOD FOR MEASURING THICKNESS OF THIN FILM, METHOD FOR FORMING POLYCRYSTAL SEMICONDUCTOR THIN FILM, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, APPARATUS FOR MANUFACTURING THE SAME, AND METHOD FOR MANUFACTURING IMAGE DISPLAY DEVICE
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Assignee
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| 3300 HAYANO MOBARA-SHI |
| CHIBA-KEN 297-8622, JAPAN |
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Correspondence name and address
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ANTONELLI, TERRY, STOUT & KRAUS, LLP
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1300 NORTH 17TH STREET
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SUITE 1800
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ARLINGTON, VA 22209
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