Patent Assignment Details
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Reel/Frame: | 018148/0001 | |
| Pages: | 5 |
| | Recorded: | 08/04/2006 | | |
Conveyance: | REQUEST CORRECTION OF 1 PATENT 6733714 OF REEL:0415;FRAME:0418 RECORDATION DATE:5/10/06 |
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Total properties:
1
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Patent #:
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Issue Dt:
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05/11/2004
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Application #:
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09918913
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Filing Dt:
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07/31/2001
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Publication #:
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Pub Dt:
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02/07/2002
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Title:
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SEMICONDUCTOR TEMPERATURE DETECTING METHOD AND ITS CIRCUIT
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Assignee
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15-6 NIHOMBASHI-KABUTOCHO |
CHUO-KU, TOKYO, JAPAN |
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Correspondence name and address
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FRANK J. JORDAN, ESQ.
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JORDAN AND HAMBURG LLP
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CHANIN BUILDING
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SUITE 4000 122 EAST 42ND STREET
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NEW YORK, NEW YORK 10168
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