Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 018517/0874 | |
| Pages: | 3 |
| | Recorded: | 11/01/2006 | | |
| Attorney Dkt #: | PS1007 US |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/07/2009
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Application #:
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11591794
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Filing Dt:
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11/01/2006
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Publication #:
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Pub Dt:
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03/27/2008
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Title:
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SCANNING PROBE MICROSCOPE FOR MEASURING ANGLE AND METHOD OF MEASURING A SAMPLE USING THE SAME
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Assignee
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| 517-13 SANGDAEWON-DONG |
| JUNGWON-GU |
| SEONGNAM-CITY, KYUNGKI-DO, KOREA, REPUBLIC OF |
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Correspondence name and address
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OMKAR K. SURYADEVARA
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SILICON VALLEY PATENT GROUP LLP
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2350 MISSION COLLEGE BOULEVARD
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SUITE 360
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SANTA CLARA, CA 95054
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