skip navigationU S P T O SealUnited States Patent and Trademark Office AOTW logo
Home|Site Index|Search|Guides|Contacts|eBusiness|eBiz alerts|News|Help
Assignments on the Web > Patent Query
Patent Assignment Details
NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:018617/0223   Pages: 4
Recorded: 11/17/2006
Attorney Dkt #:PSI008US
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
01/05/2010
Application #:
11601144
Filing Dt:
11/17/2006
Publication #:
Pub Dt:
04/03/2008
Title:
SCANNING PROBE MICROSCOPE CAPABLE OF MEASURING SAMPLES HAVING OVERHANG STRUCTURE
Assignors
1
Exec Dt:
10/23/2006
2
Exec Dt:
10/23/2006
3
Exec Dt:
10/23/2006
4
Exec Dt:
10/23/2006
5
Exec Dt:
10/23/2006
6
Exec Dt:
10/23/2006
7
Exec Dt:
10/23/2006
Assignee
1
517-13 SANGDAEWON-DONG, JUNGWON-GU, SEONGNAM-CITY
SEONGNAM-CITY, KYUNGKI-DO, KOREA, REPUBLIC OF
Correspondence name and address
OMKAR K. SURYADEVARA
SILICON VALLEY PATENT GROUP LLP
2350 MISSION COLLEGE BOULEVARD
SUITE 360
SANTA CLARA, CA 95054

Search Results as of: 05/10/2024 05:08 AM
If you have any comments or questions concerning the data displayed, contact PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified: August 25, 2017 v.2.6
| .HOME | INDEX| SEARCH | eBUSINESS | CONTACT US | PRIVACY STATEMENT