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Patent Assignment Details
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Reel/Frame:018735/0079   Pages: 2
Recorded: 12/22/2006
Attorney Dkt #:1614.1622
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
11585284
Filing Dt:
10/24/2006
Publication #:
Pub Dt:
12/27/2007
Title:
Temperature control method and apparatus and test method and apparatus of semiconductor devices
Assignors
1
Exec Dt:
11/29/2006
2
Exec Dt:
11/29/2006
Assignee
1
1-1, KAMIKODANAKA 4-CHOME
NAKAHARA-KU, KAWASAKI-SHI
KANAGAWA 211-8588, JAPAN
Correspondence name and address
STAAS & HALSEY LLP
ATTN: H.J. STAAS
1201 NEW YORK AVE., N.W., 7TH FLOOR
WASHINGTON, DC 20005

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