Patent Assignment Details
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| Reel/Frame: | 018962/0528 | |
| Pages: | 3 |
| | Recorded: | 02/02/2007 | | |
| Attorney Dkt #: | 09459.0004 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/06/2010
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Application #:
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11701379
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Filing Dt:
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02/02/2007
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Publication #:
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Pub Dt:
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08/09/2007
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Title:
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PROBE CARD AND PROBE DEVICE FOR INSPECTION OF A SEMICONDUCTOR DEVICE
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Assignee
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| 3-6, AKASAKA 5-CHOME, MINATO-KU |
| TOKYO 107-8481, JAPAN |
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Correspondence name and address
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MR. ERNEST F. CHAPMAN
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FINNEGAN, HENDERSON, FARABOW, GARRETT
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& DUNNER, L.L.P.
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901 NEW YORK AVE., N.W.
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WASHINGTON, D.C. 20001-4413
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