Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 019140/0970 | |
| Pages: | 12 |
| | Recorded: | 04/11/2007 | | |
| Conveyance: | CORRECTIVE ASSIGNMENT TO CORRECT THE CITY OF RECEIVING PARTY PREVIOUSLY RECORDED ON REEL 019084 FRAME 0854. ASSIGNOR(S) HEREBY CONFIRMS THE CITY SHOULD BE CORRECTED TO KANAGAWA. |
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Total properties:
3
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Patent #:
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Issue Dt:
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12/14/1999
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Application #:
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08684149
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Filing Dt:
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07/19/1996
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Title:
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METHOD OF AND APPARATUS FOR MEASURING FLATNESS OF SEMICONDUCTOR WAFERS THAT HAVE NOT BEEN SUBJECTED TO DONOR-KILLER TREATMENT
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Patent #:
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Issue Dt:
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06/05/2007
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Application #:
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10500268
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Filing Dt:
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06/23/2004
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Publication #:
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Pub Dt:
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04/21/2005
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Title:
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METHOD FOR VANISHING DEFECTS IN SINGLE CRYSTAL SILICON AND SINGLE CRYSTAL SILICON
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Patent #:
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Issue Dt:
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06/05/2007
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Application #:
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10512022
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Filing Dt:
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10/19/2004
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Publication #:
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Pub Dt:
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10/20/2005
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Title:
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SINGLE CRYSTAL SILICON PRODUCING METHOD, SINGLE CRYSTAL SILICON WAFER PRODUCING METHOD, SEED CRYSTAL FOR PRODUCING SINGLE CRYSTAL SILICON, SINGLE CRYSTAL SILICON INGOT, AND SINGLE CRYSTAL SILICON WAFER
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Assignee
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| 1324-2, MASURAGAHARA-MACHI |
| OMURA-SHI |
| KANAGAWA, JAPAN |
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Correspondence name and address
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GERALD T. SHEKLETON
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120 S. RIVERSIDE PLAZA, 22ND FLOOR
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CHICAGO, IL 60606
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