Patent Assignment Details
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| Reel/Frame: | 019275/0676 | |
| Pages: | 3 |
| | Recorded: | 05/10/2007 | | |
| Attorney Dkt #: | 16869S-032112US |
| Conveyance: | CORRECTIVE ASSIGNMENT TO CORRECT THE CONVEYING PARTY DATA AND RECEIVING PARTY DATA NEEDS TO BE SWITCHED. PREVIOUSLY RECORDED ON REEL 018955 FRAME 0650. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. |
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Total properties:
1
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Patent #:
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Issue Dt:
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08/14/2007
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Application #:
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11516344
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Filing Dt:
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09/05/2006
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Publication #:
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Pub Dt:
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01/04/2007
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Title:
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METHOD AND ITS APPARATUS FOR INSPECTING PARTICLES OR DEFECTS OF A SEMICONDUCTOR DEVICE
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Assignee
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| 16-3, HIGASHI 3-CHOME, SHIBUYA-KU |
| TOKYO, JAPAN |
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Correspondence name and address
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TOWNSEND AND TOWNSEND AND CREW LLP
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TWO EMBARCADERO CENTER
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8TH FLOOR
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SAN FRANCISCO, CA 94111-3834
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