Patent Assignment Details
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Reel/Frame: | 019312/0363 | |
| Pages: | 6 |
| | Recorded: | 05/14/2007 | | |
Conveyance: | CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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09/28/2004
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Application #:
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09931997
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Filing Dt:
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08/17/2001
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Publication #:
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Pub Dt:
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04/25/2002
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Title:
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METHOD AND ITS APPARATUS FOR INSPECTING PARTICLES OR DEFECTS OF A SEMICONDUCTOR DEVICE
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Assignee
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16-3, HIGASHI 3-CHOME, SHIBUYA-KU |
TOKYO, JAPAN |
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Correspondence name and address
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WILLIAM F. VOBACH
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TOWNSEND AND TOWNSEND AND CREW LLP
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TWO EMBARCADERO CENTER, EIGHTH FLOOR
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SAN FRANCISCO, CA 94111-3834
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