Patent Assignment Details
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| Reel/Frame: | 019365/0345 | |
| Pages: | 3 |
| | Recorded: | 06/01/2007 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
6
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Patent #:
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Issue Dt:
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05/06/2003
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Application #:
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09722074
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Filing Dt:
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11/27/2000
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Title:
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SEMICONDUCTOR DEVICE TESTER AND SEMICONDUCTOR DEVICE TEST METHOD
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Patent #:
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Issue Dt:
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09/02/2003
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Application #:
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10006363
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Filing Dt:
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12/10/2001
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Publication #:
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Pub Dt:
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06/13/2002
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Title:
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SEMICONDUCTOR DEVICE INSPECTING APPARATUS
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Patent #:
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Issue Dt:
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01/04/2005
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Application #:
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10078357
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Filing Dt:
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02/21/2002
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Publication #:
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Pub Dt:
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08/29/2002
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Title:
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SEMICONDUCTOR MANUFACTURING DEVICE
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Patent #:
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Issue Dt:
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03/23/2004
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Application #:
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10082247
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Filing Dt:
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02/26/2002
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Publication #:
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Pub Dt:
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09/05/2002
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Title:
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PRODUCTION MANAGING SYSTEM OF SEMICONDUCTOR DEVICE
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Patent #:
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Issue Dt:
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01/11/2005
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Application #:
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10790276
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Filing Dt:
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03/01/2004
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Publication #:
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Pub Dt:
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08/26/2004
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Title:
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PRODUCTION MANAGING SYSTEM OF SEMICONDUCTOR DEVICE
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Patent #:
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Issue Dt:
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09/20/2005
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Application #:
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10868582
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Filing Dt:
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06/15/2004
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Publication #:
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Pub Dt:
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12/02/2004
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Title:
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SEMICONDUCTOR DEVICE TESTER
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Assignee
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| 75-1 HASUNUMA-CHO, ITABASHI-KU |
| TOKYO, JAPAN 174-8580 |
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Correspondence name and address
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NEIL A. STEINBERG
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2665 MARINE WAY
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SUITE 1150
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MOUNTAIN VIEW, CALIFORNIA 94043
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