Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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Reel/Frame: | 019372/0815 | |
| Pages: | 3 |
| | Recorded: | 06/01/2007 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
5
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Patent #:
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Issue Dt:
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01/22/2008
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Application #:
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11005330
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Filing Dt:
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12/06/2004
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Publication #:
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Pub Dt:
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05/19/2005
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Title:
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PRODUCTION MANAGING SYSTEM OF SEMICONDUCTOR DEVICE
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Patent #:
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Issue Dt:
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04/20/2010
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Application #:
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11151068
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Filing Dt:
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06/13/2005
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Publication #:
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Pub Dt:
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10/20/2005
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Title:
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SURFACE CONTAMINATION ANALYZER FOR SEMICONDUCTOR WAFERS, METHOD USED THEREIN AND PROCESS FOR FABRICATING SEMICONDUCTOR DEVICE
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Patent #:
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Issue Dt:
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06/19/2007
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Application #:
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11198462
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Filing Dt:
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08/05/2005
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Publication #:
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Pub Dt:
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05/04/2006
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Title:
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CONTACT HOLE STANDARD TEST DEVICE, METHOD OF FORMING THE SAME, METHOD OF TESTING CONTACT HOLE, METHOD AND APPARATUS FOR MEASURING A THICKNESS OF A FILM, AND METHOD OF TESTING A WAFER
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Patent #:
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Issue Dt:
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06/10/2008
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Application #:
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11198780
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Filing Dt:
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08/05/2005
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Publication #:
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Pub Dt:
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09/14/2006
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Title:
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SEMICONDUCTOR DEVICE TESTER
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Patent #:
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Issue Dt:
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09/02/2008
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Application #:
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11437375
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Filing Dt:
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05/19/2006
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Publication #:
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Pub Dt:
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11/23/2006
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Title:
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SEMICONDUCTOR DEVICE TEST METHOD AND SEMICONDUCTOR DEVICE TESTER
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Assignee
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75-1 HASUNUMA-CHO, ITABASHI-KU |
TOKYO, JAPAN 174-8580 |
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Correspondence name and address
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NEIL A. STEINBERG
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2665 MARINE WAY, SUITE 1150
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MOUNTAIN VIEW, CALIFORNIA 94043
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