Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 019754/0527 | |
| Pages: | 4 |
| | Recorded: | 08/22/2007 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
8
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Patent #:
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Issue Dt:
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03/23/1993
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Application #:
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07702087
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Filing Dt:
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05/17/1991
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Title:
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METHOD AND APPARATUS FOR MEASURING INTERNAL DEFECTS FOR POSITION AND DEPTH
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Patent #:
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Issue Dt:
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11/28/1995
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Application #:
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08036986
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Filing Dt:
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03/25/1993
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Title:
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METHOD AND APPARATUS FOR MEASURING SIZE OF PARTICLE OR DEFECT
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Patent #:
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Issue Dt:
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01/10/1995
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Application #:
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08037994
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Filing Dt:
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03/25/1993
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Title:
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METHOD AND APPARATUS FOR MEASURING PHOTOLUMINESCENCE IN CRYSTAL
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Patent #:
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Issue Dt:
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06/27/1995
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Application #:
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08119768
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Filing Dt:
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09/10/1993
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Title:
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METHOD AND APPARATUS FOR THREE-DIMENSIONAL DETECTION OF PARTICLES
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Patent #:
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Issue Dt:
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06/13/1995
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Application #:
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08216190
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Filing Dt:
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03/22/1994
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Title:
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SUBSTRATE INTERNAL DEFECT AND EXTERNAL PARTICLE DETECTING APPARATUS USING S-POLARIZED AND P-POLARIZED LIGHT
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Patent #:
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Issue Dt:
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09/12/2000
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Application #:
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09139041
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Filing Dt:
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08/24/1998
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Title:
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APPARATUS AND METHOD FOR OBSERVING DEFECT
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Patent #:
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Issue Dt:
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05/22/2001
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Application #:
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09161943
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Filing Dt:
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09/28/1998
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Title:
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DEFECT EVALUATION APPARATUS FOR EVALUATING DEFECTS AND SHAPE INFORMATION THEREOF IN AN OBJECT OR ON THE SURFACE OF AN OBJECT
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Patent #:
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Issue Dt:
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07/06/2004
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Application #:
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09464191
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Filing Dt:
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12/16/1999
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Title:
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OBSERVATION APPARATUS FOR OBSERVING A DEFECT IN A MOVING TARGET OBJECT USING SCATTERED LIGHT
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Assignee
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| 1-33-3, OCHIAI |
| TAMA-SHI, TOKYO, JAPAN 206-0033 |
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Correspondence name and address
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ARTHUR R. CRAWFORD
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NIXON & VANDERHYE P.C.
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901 NORTH GLEBE ROAD
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11TH FLOOR
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ARLINGTON, VA 22203
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