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Reel/Frame:019956/0461   Pages: 3
Recorded: 09/28/2007
Attorney Dkt #:08072.0010
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
11887476
Filing Dt:
09/28/2007
Publication #:
Pub Dt:
05/21/2009
Title:
Microstructure Probe Card, and Microstructure Inspecting Device, Method, and Computer Program
Assignors
1
Exec Dt:
09/19/2007
2
Exec Dt:
09/19/2007
3
Exec Dt:
09/19/2007
Assignees
1
22-1-103, WAKABA 1-CHOME, SHINJUKU-KU
TOKYO 160-0011, JAPAN
2
3-6, AKASAKA 5-CHOME, MINATO-KU
TOKYO 107-8481, JAPAN
Correspondence name and address
MR. ERNEST F. CHAPMAN
FINNEGAN, HENDERSON, FARABOW, ET AL
901 NEW YORK AVENUE, NW
WASHINGTON, DC 20001-4413

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