Patent Assignment Details
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Reel/Frame: | 020044/0715 | |
| Pages: | 6 |
| | Recorded: | 10/31/2007 | | |
Attorney Dkt #: | 5132-0115PUS1 |
Conveyance: | CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S CITY ADDRESS IS CORRECTED FROM "AKISIMA-SHI" TO "AKISHIMA-SHI" PREVIOUSLY RECORDED ON REEL 019792 FRAME 0737. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11819710
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Filing Dt:
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06/28/2007
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Publication #:
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Pub Dt:
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10/02/2008
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Title:
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Method for X-ray wavelength measurement and X-ray wavelength measurement apparatus
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Assignee
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3-9-12, MATSUBARA-CHO, AKISHIMA-SHI |
TOKYO, JAPAN 196-8666 |
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Correspondence name and address
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BIRCH, STEWART, KOLASCH & BIRCH, LLP
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P.O. BOX 747
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FALLS CHURCH, VA 22040-0747
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