Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 020184/0105 | |
| Pages: | 2 |
| | Recorded: | 12/03/2007 | | |
| Attorney Dkt #: | 21318-US-187(CA) |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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01/04/2011
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Application #:
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11857444
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Filing Dt:
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09/19/2007
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Publication #:
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Pub Dt:
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09/18/2008
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Title:
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TEST CIRCUIT, WAFER, MEASURING APPARATUS, AND MEASURING METHOD
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Assignee
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| 1-1. KATAHIRA 2-CHOME, AOBA-KU, SENDAI |
| MIYAGI, JAPAN |
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Correspondence name and address
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JIANQ CHYUN INTELLECTUAL PROPERTY
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7F-1, NO.100, ROOSEVELT RD., SEC.2
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TAIPEI, 100 TAIWAN
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