Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 020295/0080 | |
| Pages: | 4 |
| | Recorded: | 12/27/2007 | | |
| Attorney Dkt #: | M-17035 US |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/09/2010
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Application #:
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11943931
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Filing Dt:
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11/21/2007
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Publication #:
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Pub Dt:
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05/21/2009
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Title:
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METHODS FOR INSPECTING AND OPTIONALLY REWORKING SUMMED PHOTOLITHOGRAPHY PATTERNS RESULTING FROM PLURALLY-OVERLAID PATTERNING STEPS DURING MASS PRODUCTION OF SEMICONDUCTOR DEVICES
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Assignee
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| 30 TOH GUAN ROAD, |
| #08-09 ODC DISTRICENTRE, |
| SINGAPORE, SINGAPORE 608840 |
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Correspondence name and address
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GIDEON GIMLAN
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2033 GATEWAY PLACE
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SUITE 400
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SAN JOSE, CA 95110
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