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Total properties:
18
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Patent #:
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Issue Dt:
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04/17/1990
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Application #:
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07254269
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Filing Dt:
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10/05/1988
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Title:
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METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PROBE CARDS
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Patent #:
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|
Issue Dt:
|
10/29/1991
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Application #:
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07487434
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Filing Dt:
|
03/01/1990
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Title:
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METHOD OF MAKING PROBE CARDS
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Patent #:
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Issue Dt:
|
04/16/1996
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Application #:
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07689294
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Filing Dt:
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04/22/1991
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Title:
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METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PROBE CARDS
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Patent #:
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Issue Dt:
|
11/03/1998
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Application #:
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08658659
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Filing Dt:
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06/05/1996
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Title:
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PROBE CARD ARRAY CHECK PLATE WITH TRANSITION ZONES
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Patent #:
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Issue Dt:
|
03/23/2004
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Application #:
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09265105
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Filing Dt:
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03/09/1999
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Title:
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METHODS AND APPARATUS FOR DETERMINING THE RELATIVE POSITIONS OF PROBE TIPS ON A PRINTED CIRCUIT BOARD PROBE CARD
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Patent #:
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Issue Dt:
|
07/02/2002
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Application #:
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09327106
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Filing Dt:
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06/07/1999
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Title:
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METHOD FOR OPTIMIZING PRODE CARD ANALYSIS AND SCRUB MARK ANALYSIS DATA
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Patent #:
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Issue Dt:
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09/16/2003
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Application #:
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10191039
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Filing Dt:
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07/02/2002
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Publication #:
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Pub Dt:
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11/21/2002
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Title:
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METHOD FOR OPTIMIZING PROBE CARD ANALYSIS AND SCRUB MARK ANALYSIS DATA
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|
|
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Patent #:
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Issue Dt:
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12/15/2009
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Application #:
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10323696
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Filing Dt:
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12/18/2002
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Publication #:
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Pub Dt:
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07/24/2003
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Title:
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DUAL-AXIS SCANNING SYSTEM AND METHOD
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Patent #:
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Issue Dt:
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06/12/2007
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Application #:
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10323720
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Filing Dt:
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12/18/2002
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Publication #:
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Pub Dt:
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07/31/2003
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Title:
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STEREOSCOPIC THREE-DIMENSIONAL METROLOGY SYSTEM AND METHOD
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Patent #:
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Issue Dt:
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09/05/2006
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Application #:
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10788670
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Filing Dt:
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02/27/2004
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Publication #:
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Pub Dt:
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11/18/2004
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Title:
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METHOD OF APPLYING THE ANALYSIS OF SCRUB MARK MORPHOLOGY AND LOCATION TO THE EVALUATION AND CORRECTION OF SEMICONDUCTOR TESTING, ANALYSIS, AND MANUFACTURE
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Patent #:
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Issue Dt:
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01/30/2007
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Application #:
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10799575
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Filing Dt:
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03/12/2004
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Publication #:
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Pub Dt:
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11/18/2004
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Title:
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SYSTEM AND METHOD OF MITIGATING EFFECTS OF COMPONENT DEFLECTION IN A PROBE CARD ANALYZER
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Patent #:
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Issue Dt:
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04/23/2013
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Application #:
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10800420
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Filing Dt:
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03/12/2004
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Publication #:
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Pub Dt:
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11/11/2004
| | | | |
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Title:
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System and method of non-linear grid fitting and coordinate system mapping
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Patent #:
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Issue Dt:
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01/17/2006
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Application #:
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10801925
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Filing Dt:
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03/15/2004
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Publication #:
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Pub Dt:
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01/20/2005
| | | | |
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Title:
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SYSTEM AND METHOD OF PLANAR POSITIONING
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Patent #:
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|
Issue Dt:
|
12/15/2009
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Application #:
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10801944
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Filing Dt:
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03/15/2004
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Publication #:
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Pub Dt:
|
11/11/2004
| | | | |
|
Title:
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SYSTEM AND METHOD OF MEASURING PROBE FLOAT
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|
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|
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Patent #:
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|
Issue Dt:
|
07/06/2010
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Application #:
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11479822
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Filing Dt:
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06/29/2006
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|
Publication #:
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|
Pub Dt:
|
11/02/2006
| | | | |
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Title:
|
METHOD OF APPLYING THE ANALYSIS OF SCRUB MARK MORPHOLOGY AND LOCATION TO THE EVALUATION AND CORRECTION OF SEMICONDUCTOR TESTING, ANALYSIS, AND MANUFACTURE
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Patent #:
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Issue Dt:
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06/10/2008
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Application #:
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11609881
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Filing Dt:
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12/12/2006
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Publication #:
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Pub Dt:
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05/10/2007
| | | | |
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Title:
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SYSTEM AND METHOD OF MITIGATING EFFECTS OF COMPONENT DEFLECTION IN A PROBE CARD ANALYZER
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Patent #:
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Issue Dt:
|
02/16/2010
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Application #:
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11668457
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Filing Dt:
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01/29/2007
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Publication #:
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Pub Dt:
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08/02/2007
| | | | |
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Title:
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HIGH-SPEED CAPACITOR LEAKAGE MEASUREMENT SYSTEMS AND METHODS
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Patent #:
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Issue Dt:
|
12/15/2009
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Application #:
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11751617
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Filing Dt:
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05/21/2007
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Publication #:
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Pub Dt:
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11/22/2007
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Title:
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STEREOSCOPIC THREE-DIMENSIONAL METROLOGY SYSTEM AND METHOD
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