Patent Assignment Details
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Reel/Frame: | 020800/0766 | |
| Pages: | 13 |
| | Recorded: | 04/14/2008 | | |
Conveyance: | CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/03/2008
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Application #:
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10363746
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Filing Dt:
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08/25/2003
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Publication #:
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Pub Dt:
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02/26/2004
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Title:
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APPARATUS FOR INSPECTING WAFER SURFACE, METHOD FOR INSPECTING WAFER SURFACE, APPARATUS FOR JUDGING DEFECTIVE WAFER, METHOD FOR JUDGING DEFECTIVE WAFER, AND APPARATUS FOR PROCESSING INFORMATION ON WAFER SURFACE
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Assignee
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1324-2, MASURAGAHARA-MACHI |
OMURA-SHI |
NAGASAKI, JAPAN 856-8555 |
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Correspondence name and address
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GERALD T. SHEKLETON
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120 S. RIVERSIDE PLAZA, 22ND FLOOR
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CHICAGO, IL 60606
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